Title :
A new on-wafer multiline thru-reflect-line (TRL) calibration standard design
Author :
Haiyan Lu ; Zhijiang Zhou ; Cheng Wei ; Jianjun Zhou ; Tangshen Chen ; Chen Chen
Author_Institution :
Sci. & Technol. on Monolithic Integrated Circuits & Modules Lab., Nanjing, China
Abstract :
By using invert microstrip, a new on wafer multiline TRL calibration kits for THz measurement are designed in this paper. Our approach is based on the multi-frequency formulation of the vector network analyzer calibration problem. The calibration kits are designed covers a range of frequencies from 70 to 220 GHz. The simulator results are given in this paper.
Keywords :
calibration; microstrip lines; millimetre wave measurement; network analysers; terahertz wave imaging; THz measurement; TRL; calibration standard design; frequency 70 GHz to 220 GHz; invert microstrip; on-wafer multiline thru-reflect-line; vector network analyzer calibration problem; Calibration; Measurement uncertainty; Microstrip; Power transmission lines; Standards; Transistors; Transmission line measurements; Multi-line TRL calibration; On wafer calibration; THz measurement; invert microstrip; transistor measurement;
Conference_Titel :
Antennas and Propagation (APCAP), 2014 3rd Asia-Pacific Conference on
Conference_Location :
Harbin
Print_ISBN :
978-1-4799-4355-5
DOI :
10.1109/APCAP.2014.6992655
