DocumentCode
1775991
Title
Investigation on the EMP damage characteristics of RF/microwave PIN diode limiter
Author
Dongdong Wang ; Lan Gao ; Shengquan Zheng ; Feng Deng ; Dongyun Hou
Author_Institution
Sci. & Technol. on Electromagn. Compatibility Lab., Wuhan, China
fYear
2014
fDate
26-29 July 2014
Firstpage
1370
Lastpage
1372
Abstract
The effects of EMP of different types and different energy will lead to different levels of damage in limiters employed in RF and microwave receivers. After damaged, the limiters still preserve some original functions and thus the systems they served will suffer performance degradation instead of invalidation. In this paper we made research on the damage threshold and damage effects of typical limiters, and discovered that the limiter will suffer irreversible cumulated damage.
Keywords
electromagnetic pulse; microwave limiters; p-i-n diodes; EMP; PIN diode limiter; RF receivers; damage effects; damage threshold; irreversible cumulated damage; microwave receivers; Degradation; Insertion loss; Loss measurement; PIN photodiodes; Pulse measurements; Radio frequency; Receiving antennas; EMP; Limiter; PIN diode; Schottky Diode; damage;
fLanguage
English
Publisher
ieee
Conference_Titel
Antennas and Propagation (APCAP), 2014 3rd Asia-Pacific Conference on
Conference_Location
Harbin
Print_ISBN
978-1-4799-4355-5
Type
conf
DOI
10.1109/APCAP.2014.6992779
Filename
6992779
Link To Document