• DocumentCode
    1775991
  • Title

    Investigation on the EMP damage characteristics of RF/microwave PIN diode limiter

  • Author

    Dongdong Wang ; Lan Gao ; Shengquan Zheng ; Feng Deng ; Dongyun Hou

  • Author_Institution
    Sci. & Technol. on Electromagn. Compatibility Lab., Wuhan, China
  • fYear
    2014
  • fDate
    26-29 July 2014
  • Firstpage
    1370
  • Lastpage
    1372
  • Abstract
    The effects of EMP of different types and different energy will lead to different levels of damage in limiters employed in RF and microwave receivers. After damaged, the limiters still preserve some original functions and thus the systems they served will suffer performance degradation instead of invalidation. In this paper we made research on the damage threshold and damage effects of typical limiters, and discovered that the limiter will suffer irreversible cumulated damage.
  • Keywords
    electromagnetic pulse; microwave limiters; p-i-n diodes; EMP; PIN diode limiter; RF receivers; damage effects; damage threshold; irreversible cumulated damage; microwave receivers; Degradation; Insertion loss; Loss measurement; PIN photodiodes; Pulse measurements; Radio frequency; Receiving antennas; EMP; Limiter; PIN diode; Schottky Diode; damage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation (APCAP), 2014 3rd Asia-Pacific Conference on
  • Conference_Location
    Harbin
  • Print_ISBN
    978-1-4799-4355-5
  • Type

    conf

  • DOI
    10.1109/APCAP.2014.6992779
  • Filename
    6992779