Title :
Investigation on the EMP damage characteristics of RF/microwave PIN diode limiter
Author :
Dongdong Wang ; Lan Gao ; Shengquan Zheng ; Feng Deng ; Dongyun Hou
Author_Institution :
Sci. & Technol. on Electromagn. Compatibility Lab., Wuhan, China
Abstract :
The effects of EMP of different types and different energy will lead to different levels of damage in limiters employed in RF and microwave receivers. After damaged, the limiters still preserve some original functions and thus the systems they served will suffer performance degradation instead of invalidation. In this paper we made research on the damage threshold and damage effects of typical limiters, and discovered that the limiter will suffer irreversible cumulated damage.
Keywords :
electromagnetic pulse; microwave limiters; p-i-n diodes; EMP; PIN diode limiter; RF receivers; damage effects; damage threshold; irreversible cumulated damage; microwave receivers; Degradation; Insertion loss; Loss measurement; PIN photodiodes; Pulse measurements; Radio frequency; Receiving antennas; EMP; Limiter; PIN diode; Schottky Diode; damage;
Conference_Titel :
Antennas and Propagation (APCAP), 2014 3rd Asia-Pacific Conference on
Conference_Location :
Harbin
Print_ISBN :
978-1-4799-4355-5
DOI :
10.1109/APCAP.2014.6992779