• DocumentCode
    1776156
  • Title

    Performance evaluation of multi-gate fets using the BSIM-CMG model

  • Author

    Patil, Nahush ; Martin, Cecilia Garcia ; Oruklu, Erdal

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Illinois Inst. of Technol., Chicago, IL, USA
  • fYear
    2014
  • fDate
    5-7 June 2014
  • Firstpage
    256
  • Lastpage
    259
  • Abstract
    In this paper, different multi-gate transistor configurations are analyzed using the BSIM-CMG model with emphasis on performance scaling with parameter changes. We examine the effect of key parameters on the leakage current, delay and dynamic power for basic logic gates and the mirror adder. Simulation results indicate a linear increase in the leakage current and the dynamic power with increasing number of fins. On the other hand, with larger number of gates, the static current decreases. Minimum static power dissipation can be achieved with high number of gates and a lesser number of fins.
  • Keywords
    adders; field effect transistors; logic gates; BSIM-CMG model; dynamic power; leakage current; logic gates; minimum static power dissipation; mirror adder; multigate FET; multigate transistor configurations; parameter changes; performance evaluation; performance scaling; Adders; Delays; FinFETs; Integrated circuit modeling; Logic gates; Mirrors; BSIM-CMG; FinFET; fingers; fins; multi-gate transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electro/Information Technology (EIT), 2014 IEEE International Conference on
  • Conference_Location
    Milwaukee, WI
  • Type

    conf

  • DOI
    10.1109/EIT.2014.6871772
  • Filename
    6871772