DocumentCode
1776156
Title
Performance evaluation of multi-gate fets using the BSIM-CMG model
Author
Patil, Nahush ; Martin, Cecilia Garcia ; Oruklu, Erdal
Author_Institution
Dept. of Electr. & Comput. Eng., Illinois Inst. of Technol., Chicago, IL, USA
fYear
2014
fDate
5-7 June 2014
Firstpage
256
Lastpage
259
Abstract
In this paper, different multi-gate transistor configurations are analyzed using the BSIM-CMG model with emphasis on performance scaling with parameter changes. We examine the effect of key parameters on the leakage current, delay and dynamic power for basic logic gates and the mirror adder. Simulation results indicate a linear increase in the leakage current and the dynamic power with increasing number of fins. On the other hand, with larger number of gates, the static current decreases. Minimum static power dissipation can be achieved with high number of gates and a lesser number of fins.
Keywords
adders; field effect transistors; logic gates; BSIM-CMG model; dynamic power; leakage current; logic gates; minimum static power dissipation; mirror adder; multigate FET; multigate transistor configurations; parameter changes; performance evaluation; performance scaling; Adders; Delays; FinFETs; Integrated circuit modeling; Logic gates; Mirrors; BSIM-CMG; FinFET; fingers; fins; multi-gate transistors;
fLanguage
English
Publisher
ieee
Conference_Titel
Electro/Information Technology (EIT), 2014 IEEE International Conference on
Conference_Location
Milwaukee, WI
Type
conf
DOI
10.1109/EIT.2014.6871772
Filename
6871772
Link To Document