• DocumentCode
    1776194
  • Title

    Remotely accessible computer network laboratory with hands-on experience

  • Author

    Monsef, Ehsan ; Gilliland, Scott ; Anjali, Tricha ; Saniie, Jafar

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Illinois Inst. of Technol., Chicago, IL, USA
  • fYear
    2014
  • fDate
    5-7 June 2014
  • Firstpage
    367
  • Lastpage
    372
  • Abstract
    This paper presents the design and evaluation of a remotely accessible and platform-independent computer network laboratory. We have integrated two network standards namely IPKVM and VLAN to create a flexible and expandable laboratory system for remote students. Students located at remote sites were able to seamlessly conduct hands-on experiments and collaborate with their classmates. A survey was conducted among the students who enrolled in the “Introduction to Computer Networks laboratory” course at Illinois Institute of Technology. The results show that students can complete the lab experiments efficiently, and the remote framework does not impose any barrier in conducting experiments and consequently does not degrade the quality of their education. The system developed in our institution can be used for other laboratory courses such as computer networking security and system administration.
  • Keywords
    computer aided instruction; computer network security; distance learning; educational courses; laboratories; local area networks; telecommunication computing; telecommunication engineering education; IPKVM; Illinois Institute of Technology; VLAN; computer networking security; flexible expandable laboratory system; hands-on experience; introduction to computer network laboratory course; platform-independent computer network laboratory; remote sites; remote students; remotely accessible computer network laboratory; system administration; Education; Industries; Internet; Laboratories; Mice; Workstations;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electro/Information Technology (EIT), 2014 IEEE International Conference on
  • Conference_Location
    Milwaukee, WI
  • Type

    conf

  • DOI
    10.1109/EIT.2014.6871792
  • Filename
    6871792