Title :
Symbol error rate analysis for cooperative diversity networks by distributed embedded space time code
Author :
Norouzi, Mohammad ; Attang, Edidong ; Yuteng Wu ; Atkin, G.E.
Author_Institution :
Dept. of Electr. & Comput. Eng., Illinois Inst. of Technol. (IIT), Chicago, IL, USA
Abstract :
In this paper a special version of cooperative distributed space time coding for the relays network is proposed. According to this system model relays cooperatively collaborate with the sources to transmit the space time code to the destination. Process of the transmission consists of two phases. In the first time phase source broadcast the information to the destination and relay. In the next time phase, the source and relay cooperatively send signals to the destination by using an embedded space time coding. Structure of embedded space time code is based on singular value decomposition of circulant matrix. Relays are assumed to be non-regenerative amplify-and-forward. Theoretical analysis for calculating the bit error rate (BER) has been done based on maximum ratio combining (MRC). Simulation results for the case of one relay, one source and destination through the Rayleigh fading channel has been done and compared with the scenario when transmitter and relay used the Alamouti code.
Keywords :
Rayleigh channels; amplify and forward communication; diversity reception; error statistics; relay networks (telecommunication); singular value decomposition; space-time codes; Alamouti code; BER; MRC; Rayleigh fading channel; bit error rate; circulant matrix; cooperative distributed space time coding; cooperative diversity networks; maximum ratio combining; nonregenerative amplify-and-forward; relays network; singular value decomposition; symbol error rate analysis; Base stations; Bit error rate; Mathematical model; Relay networks (telecommunications); Space-time codes; Wireless communication; BER rate probability of error; Maximum ratio combiner; relay network; space time code; symbol error rate;
Conference_Titel :
Electro/Information Technology (EIT), 2014 IEEE International Conference on
Conference_Location :
Milwaukee, WI
DOI :
10.1109/EIT.2014.6871801