DocumentCode :
1776627
Title :
A dynamic lognormal stress-strength reliability model with application to power system insulation devices
Author :
Chiodo, Elio
Author_Institution :
Dipt. di Ing. dell´Energia Elettr. e dell´Inf., Univ. degli Studi di Napoli Federico II, Naples, Italy
fYear :
2014
fDate :
18-20 June 2014
Firstpage :
1122
Lastpage :
1127
Abstract :
In order to develop a reliability model for power system devices, such as insulating materials, subjected to both stresses and aging, the paper proposes a dynamic “stress-strength” model. The model is based upon Lognormal distributions for stress and strength, including their dynamic variability, giving rise to a new probability distribution, the so-called Shining distribution, seeming appropriate for insulation devices. The main features of the model are illustrated, showing that it possesses a non monotone hazard rate function. Its approximations with some of the most popular reliability models adopted in this field, such as the Weibull, Normal or Lognormal distribution is discussed, with some caveats regarding lifetime quantiles and hazard rate assessment. Then, Maximum Likelihood method for the statistical inference on the above model is discussed, with emphasis on interval estimation, which can be performed by means of a Beta distribution approximation of the unknown estimator distribution. The method gives satisfactory results, as shown in the last part of the paper.
Keywords :
Weibull distribution; insulating materials; log normal distribution; maximum likelihood estimation; mechanical strength; power electronics; reliability; stress analysis; Shining distribution; Weibull distribution; beta distribution approximation; dynamic lognormal stress-strength reliability model; dynamic variability; estimator distribution; hazard rate assessment; insulating materials; interval estimation; lifetime quantiles; lognormal distributions; maximum likelihood method; nonmonotone hazard rate function; power system insulation devices; probability distribution; statistical inference; Approximation methods; Maximum likelihood estimation; Power system reliability; Radio frequency; Reliability; Stress; Electric power systems; Interval estimation; Reliability; Shining distribution; Stress-Strength models;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Electronics, Electrical Drives, Automation and Motion (SPEEDAM), 2014 International Symposium on
Conference_Location :
Ischia
Type :
conf
DOI :
10.1109/SPEEDAM.2014.6872012
Filename :
6872012
Link To Document :
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