Title :
Monte-carlo and transient-noise simulational analysis of rolling-shutter binary readout pixel circuit
Author :
Jankowski, Mariusz
Author_Institution :
Dept. of Microelectron. & Comput. Sci., Lodz Univ. of Technol., Lodz, Poland
Abstract :
A non-typical approach to extended simulational analysis for rolling-shutter (switching power) binary readout pixel circuit is presented. Circuit solutions as well as simulation test results are presented and discussed. Previously undetected phenomenon is detected, its cause tracked down and the issue removed, solely by means of control signal sequence modifications, with no hardware modification required.
Keywords :
Monte Carlo methods; readout electronics; switching circuits; transient analysis; Monte-Carlo simulational analysis; control signal sequence modifications; rolling-shutter binary readout pixel circuit; simulation test; switching power binary readout pixel circuit; transient-noise simulational analysis; Computational modeling; Integrated circuit modeling; Latches; Noise; Sensors; Transient analysis; Monte-Carlo simulations; binary readout pixel; rolling shutter; swithing-power; transient noise simulation;
Conference_Titel :
Mixed Design of Integrated Circuits & Systems (MIXDES), 2014 Proceedings of the 21st International Conference
Conference_Location :
Lublin
Print_ISBN :
978-83-63578-03-9
DOI :
10.1109/MIXDES.2014.6872211
