Title :
COTS FPGA/SRAM irradiations using a dedicated testing infrastructure for characterization of large component batches
Author :
Uznanski, Slawosz ; Todd, Benjamin ; Walter, Johannes ; Vilar-Villanueva, Andrea
Author_Institution :
Technol. Dept., Eur. Organ. for Nucl. Res. (CERN), Meyrin, Switzerland
Abstract :
This paper introduces a new testing platform for irradiation of large batches of COTS FPGA and SRAMs. The main objective is measurement of component radiation response and assessment of component-to-component variability within one batch. The first validation and test results using the testing platform are presented for 150nm TFT SRAM (Renesas) and different sizes of the 130nm ProASIC3 FPGA (Microsemi).
Keywords :
SRAM chips; field programmable gate arrays; integrated circuit testing; logic testing; radiation hardening (electronics); COTS FPGA-SRAM irradiations; ProASIC3 FPGA; TFT SRAM; component radiation response measurement; component-to-component variability; dedicated testing infrastructure; large component batches characterization; size 130 nm; size 150 nm; testing platform; Collimators; Field programmable gate arrays; Large Hadron Collider; Protons; Radiation effects; Random access memory; Commercial-Off-The-Shelf (COTS) components; Field Programmable Gate Array (FPGA); Single Event Effects (SEE); Static Random Access Memory (SRAM); Total Ioninzing Dose (TID);
Conference_Titel :
Mixed Design of Integrated Circuits & Systems (MIXDES), 2014 Proceedings of the 21st International Conference
Conference_Location :
Lublin
Print_ISBN :
978-83-63578-03-9
DOI :
10.1109/MIXDES.2014.6872223
