• DocumentCode
    1777200
  • Title

    Effect of HfO2 and Al2O3 on monolayer MoS2 electronic structure

  • Author

    Valsaraj, Amithraj ; Jiwon Chang ; Register, Leonard F. ; Banerjee, Sanjay K.

  • Author_Institution
    Microelectron. Res. Center, Univ. of Texas at Austin, Austin, TX, USA
  • fYear
    2014
  • fDate
    22-25 June 2014
  • Firstpage
    87
  • Lastpage
    88
  • Abstract
    Transition metal dichalcogenides (TMDs) are novel, and unlike graphene, gapped 2D materials with unique electrical and optical properties that are being explored for novel device applications. Their 2D nature also makes their properties sensitive to the surrounding environment. For example, a free standing monolayer of MoS2 - which has an experimentally reported direct band gap of Eg ≈ 1.8 eV1 - has a very low reported mobility (μ<;3 cm2/(V-s)),2 but exhibits significant enhancement of its mobility (μ~200 cm2/(V-s)) when superposed with a high-k dielectric like HfO2.3 Here, we study the effect of HfO2 and Al2O3 on monolayer MoS2 using density functional theory (DFT).
  • Keywords
    aluminium compounds; density functional theory; electron mobility; energy gap; hafnium compounds; high-k dielectric thin films; molybdenum compounds; monolayers; Al2O3-MoS2; DFT; HfO2-MoS2; aluminum oxide effect; density functional theory; direct band gap; electrical properties; electron mobility; gapped 2D materials; graphene; hafnium oxide effect; high-k dielectric like hafnium oxide; monolayer molybdenum sulfide electronic structure; optical properties; transition metal dichalcogenides; Aluminum oxide; Atomic layer deposition; Hafnium compounds; Passivation; Photonic band gap; Scattering; Slabs;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Device Research Conference (DRC), 2014 72nd Annual
  • Conference_Location
    Santa Barbara, CA
  • Print_ISBN
    978-1-4799-5405-6
  • Type

    conf

  • DOI
    10.1109/DRC.2014.6872310
  • Filename
    6872310