DocumentCode :
1777233
Title :
InGaAs tri-gate MOSFETs with MOVPE regrown source/drain
Author :
Mishima, Yuuki ; Kanazawa, Toru ; Kinoshita, Hiroyuki ; Uehara, Eiji ; Miyamoto, Yutaka
Author_Institution :
Dept. Phys. Electron., Tokyo Inst. of Technol., Tokyo, Japan
fYear :
2014
fDate :
22-25 June 2014
Firstpage :
121
Lastpage :
122
Abstract :
InGaAs MOSFETs are attractive candidate for future high-speed and low-power-consumption devices. To enhance the performance of that, we propose a novel device structure which contains the superior current controllability due to the tri-gate structure and the high current drivability due to the n+-InGaAs source surrounding the non-planar channel. In this report, we demonstrate the source regrowth process for non-planar channel structure and current characteristics of the device fabricated by using regrowth.
Keywords :
III-V semiconductors; MOCVD; MOSFET; gallium arsenide; indium compounds; vapour phase epitaxial growth; InGaAs; MOVPE regrown source-drain process; current controllability; device structure; high current drivability; high-speed devices; low-power-consumption devices; nonplanar channel structure; tri-gate MOSFETs; tri-gate structure; Epitaxial growth; Epitaxial layers; Indium gallium arsenide; Indium phosphide; Logic gates; MOSFET;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Device Research Conference (DRC), 2014 72nd Annual
Conference_Location :
Santa Barbara, CA
Print_ISBN :
978-1-4799-5405-6
Type :
conf
DOI :
10.1109/DRC.2014.6872327
Filename :
6872327
Link To Document :
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