• DocumentCode
    1777233
  • Title

    InGaAs tri-gate MOSFETs with MOVPE regrown source/drain

  • Author

    Mishima, Yuuki ; Kanazawa, Toru ; Kinoshita, Hiroyuki ; Uehara, Eiji ; Miyamoto, Yutaka

  • Author_Institution
    Dept. Phys. Electron., Tokyo Inst. of Technol., Tokyo, Japan
  • fYear
    2014
  • fDate
    22-25 June 2014
  • Firstpage
    121
  • Lastpage
    122
  • Abstract
    InGaAs MOSFETs are attractive candidate for future high-speed and low-power-consumption devices. To enhance the performance of that, we propose a novel device structure which contains the superior current controllability due to the tri-gate structure and the high current drivability due to the n+-InGaAs source surrounding the non-planar channel. In this report, we demonstrate the source regrowth process for non-planar channel structure and current characteristics of the device fabricated by using regrowth.
  • Keywords
    III-V semiconductors; MOCVD; MOSFET; gallium arsenide; indium compounds; vapour phase epitaxial growth; InGaAs; MOVPE regrown source-drain process; current controllability; device structure; high current drivability; high-speed devices; low-power-consumption devices; nonplanar channel structure; tri-gate MOSFETs; tri-gate structure; Epitaxial growth; Epitaxial layers; Indium gallium arsenide; Indium phosphide; Logic gates; MOSFET;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Device Research Conference (DRC), 2014 72nd Annual
  • Conference_Location
    Santa Barbara, CA
  • Print_ISBN
    978-1-4799-5405-6
  • Type

    conf

  • DOI
    10.1109/DRC.2014.6872327
  • Filename
    6872327