DocumentCode
1777233
Title
InGaAs tri-gate MOSFETs with MOVPE regrown source/drain
Author
Mishima, Yuuki ; Kanazawa, Toru ; Kinoshita, Hiroyuki ; Uehara, Eiji ; Miyamoto, Yutaka
Author_Institution
Dept. Phys. Electron., Tokyo Inst. of Technol., Tokyo, Japan
fYear
2014
fDate
22-25 June 2014
Firstpage
121
Lastpage
122
Abstract
InGaAs MOSFETs are attractive candidate for future high-speed and low-power-consumption devices. To enhance the performance of that, we propose a novel device structure which contains the superior current controllability due to the tri-gate structure and the high current drivability due to the n+-InGaAs source surrounding the non-planar channel. In this report, we demonstrate the source regrowth process for non-planar channel structure and current characteristics of the device fabricated by using regrowth.
Keywords
III-V semiconductors; MOCVD; MOSFET; gallium arsenide; indium compounds; vapour phase epitaxial growth; InGaAs; MOVPE regrown source-drain process; current controllability; device structure; high current drivability; high-speed devices; low-power-consumption devices; nonplanar channel structure; tri-gate MOSFETs; tri-gate structure; Epitaxial growth; Epitaxial layers; Indium gallium arsenide; Indium phosphide; Logic gates; MOSFET;
fLanguage
English
Publisher
ieee
Conference_Titel
Device Research Conference (DRC), 2014 72nd Annual
Conference_Location
Santa Barbara, CA
Print_ISBN
978-1-4799-5405-6
Type
conf
DOI
10.1109/DRC.2014.6872327
Filename
6872327
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