DocumentCode :
177728
Title :
Improvement of Benign and Malignant Probability Detection Based on Non-subsample Contourlet Transform and Super-resolution
Author :
Pak, F. ; Kanan, H.R. ; Alikhassi, A.
Author_Institution :
Dept. of Comput. & Inf. Technol. Eng., Islamic Azad Univ., Qazvin, Iran
fYear :
2014
fDate :
24-28 Aug. 2014
Firstpage :
895
Lastpage :
899
Abstract :
Mammography is a standard method for early diagnosis of breast cancer. In this paper, a method has been provided for improving quality of mammographic images to help radiologists so that probability of benign or malign breast lesions can be detected faster and more accurate and false positive rate (FPR) can be reduced. The presented algorithm includes 3 main parts of preprocessing, feature extraction and classification. In the preprocessing stage, a region of interest (ROI) is determined and quality of images is improved by non sub-sample contour let transform (NSCT) and super resolution (SR) algorithm altogether. In feature extraction stage, some features of the image components are extracted and skewness of each feature is calculated. Finally, support vector machine (SVM) is used to classify and determine probability of benign and malign disease. The obtained results on MIAS database indicate efficiency of the proposed algorithm.
Keywords :
cancer; feature extraction; image classification; image resolution; mammography; medical image processing; probability; support vector machines; transforms; MIAS database; NSCT; SVM; benign breast lesion probability detection; breast cancer diagnosis; feature extraction; image classification; image quality; malignant breast lesion probability detection; mammographic images; nonsubsample contourlet transform; superresolution algorithm; support vector machine; Accuracy; Classification algorithms; Feature extraction; Image edge detection; Image resolution; Support vector machines; Transforms; BI-RADS; Breast cancer; MIAS database; Mammography; Non sub-sample contourlet transform; Super resolution; Support vector machine;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Pattern Recognition (ICPR), 2014 22nd International Conference on
Conference_Location :
Stockholm
ISSN :
1051-4651
Type :
conf
DOI :
10.1109/ICPR.2014.164
Filename :
6976874
Link To Document :
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