• DocumentCode
    1777303
  • Title

    Evaluating Au and Pd contacts in mono and multilayer MoS2 transistors

  • Author

    Kaushik, Neelam ; Nipane, Ankur ; Basheer, Firdous ; Dubey, Souvik ; Grover, Sachit ; Deshmukh, Minal ; Lodha, Saurabh

  • Author_Institution
    Dept. of Electr. Eng., IIT Bombay, Mumbai, India
  • fYear
    2014
  • fDate
    22-25 June 2014
  • Firstpage
    195
  • Lastpage
    196
  • Abstract
    The search of a p-type metal contact on MoS2 has remained inconclusive, with high work-function metals such as Au, Ni and Pt showing n-type behavior [1] and mixed reports of n as well as p-type behavior for Pd. In this work we report for the first time, quantitative band alignment of Pd and Au-MoS2 interfaces using low temperature and scanning photocurrent measurements on MoS2 transistors with varying metal contacts (Au-Au, Pd-Pd and Au-Pd). Our results indicate n-type behavior for Pd contacts on multilayer as well as monolayer MoS2 transistors and a barrier height (Φb) of nearly 0.5 eV, four times that for Au contacts indicating that the MoS2 Fermi-level is pinned in the upper half of MoS2 bandgap.
  • Keywords
    electrical contacts; field effect transistors; gold; molybdenum compounds; multilayers; palladium; work function; Au-MoS2; Fermi-level; Pd-MoS2; bandgap; barrier height; contact evaluation; low temperature measurements; mono transistors; multilayer transistors; n-type behavior; p-type metal contact; quantitative band alignment; scanning photocurrent measurements; work-function metals; Gold; Nonhomogeneous media; Photoconductivity; Photonic band gap; Temperature measurement; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Device Research Conference (DRC), 2014 72nd Annual
  • Conference_Location
    Santa Barbara, CA
  • Print_ISBN
    978-1-4799-5405-6
  • Type

    conf

  • DOI
    10.1109/DRC.2014.6872364
  • Filename
    6872364