DocumentCode :
1777381
Title :
Thin-film circuits for scalable interfacing between large-area electronics and CMOS ICs
Author :
Moy, Tiffany ; Rieutort-Louis, Warren ; Yingzhe Hu ; Liechao Huang ; Sanz-Robinson, Josue ; Sturm, James C. ; Wagner, Steffen ; Verma, Naveen
Author_Institution :
Dept. of Electr. Eng., Princeton Univ., Princeton, NJ, USA
fYear :
2014
fDate :
22-25 June 2014
Firstpage :
271
Lastpage :
272
Abstract :
Hybrid systems based on large-area electronics (LAE) and CMOS ICs aim to exploit the complementary strengths of the two technologies: the scalability of LAE for forming interconnects and transducers (for sensing and energy harvesting), and the energy efficiency of CMOS for instrumentation and computation. The viability of large-scale systems depends on maximizing the robustness and minimizing the number of interfaces between the LAE and CMOS domains. To maximize robustness, inductive and capacitive coupling has been explored, avoiding the need for metallurgical bonding [1]. To minimize the number of interfaces, a method to access and readout individual sensors via minimal coupling channels, is crucial. In this abstract, we present a thin-film transistor (TFT) based scanning circuit that requires only three capacitively-coupled control signals from the IC to sequentially access an arbitrarily large number of LAE sensors, enabling a single readout interface (Fig. 1). A key attribute of the presented circuit is the low power consumption, which remains nearly constant even as the number of sensors scales.
Keywords :
CMOS integrated circuits; readout electronics; thin film circuits; thin film sensors; thin film transistors; transistor circuits; CMOS ICs; LAE scalability; LAE sensors; TFT based scanning circuit; capacitive coupling; capacitively-coupled control signals; energy efficiency; hybrid systems; inductive coupling; interconnects; large-area electronics; large-scale systems; low power consumption; metallurgical bonding; minimal coupling channels; single readout interface; thin-film circuits; thin-film transistor; transducers; CMOS integrated circuits; Clocks; Frequency conversion; Power demand; Sensors; Thin film transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Device Research Conference (DRC), 2014 72nd Annual
Conference_Location :
Santa Barbara, CA
Print_ISBN :
978-1-4799-5405-6
Type :
conf
DOI :
10.1109/DRC.2014.6872402
Filename :
6872402
Link To Document :
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