Comparative analyses of phase noise in differential oscillator topologies in 28 nm CMOS technology

Author

Chlis, Ilias ; Pepe, Domenico ; Zito, Domenico

Author_Institution

Tyndall Nat. Inst., “Lee Maltings”, Cork, Ireland

fYear

2014

fDate

June 30 2014-July 3 2014

Firstpage

1

Lastpage

4

Abstract

This paper reports comparative analyses of phase noise in common-source cross-coupled differential pair, differential Colpitts, Hartley and Armstrong LC oscillator topologies designed in 28 nm CMOS technology for 10 GHz operations. The Impulse Sensitivity Function is used to carry out qualitative and quantitative analyses of the phase noise exhibited by each circuit component in each topology. The analyses show that the lowest phase noise is exhibited by the differential Armstrong topology. Additionally, the results show the impact of flicker noise on phase noise performances.

Keywords

CMOS analogue integrated circuits; MMIC oscillators; field effect MMIC; flicker noise; Armstrong LC oscillator topology; CMOS technology; Hartley oscillator topology; circuit component; common-source cross-coupled differential pair; differential Colpitts oscillator topology; differential oscillator topology; flicker noise; frequency 10 GHz; impulse sensitivity function; phase noise performances; qualitative analyses; quantitative analyses; size 28 nm; 1f noise; CMOS integrated circuits; Phase noise; Topology; Transistors; impulse sensitivity function; oscillators; phase noise;

fLanguage

English

Publisher

ieee

Conference_Titel

Ph.D. Research in Microelectronics and Electronics (PRIME), 2014 10th Conference on

Conference_Location

Grenoble

Type

conf

DOI

10.1109/PRIME.2014.6872664

Filename

6872664