Title :
Temperature study of high-drive capability buffer for phase change memories
Author :
Kiouseloglou, A. ; Covi, E. ; Navarro, G. ; Cabrini, A. ; Perniola, L. ; Torelli, G.
Author_Institution :
CEA-LETI, Grenoble, France
fDate :
June 30 2014-July 3 2014
Abstract :
Phase Change Memory (PCM) is a non-volatile memory technology with wide programming window and continuously improving data retention performance. In order to drive the variable load PCM exhibits, the amplifier providing programming pulses to the cell must be able to accurately control pulse parameters. In this paper, we present a unity gain buffer capable of driving resistive loads varying up to three orders of magnitude. The buffer can replicate voltage pulses of amplitude up to 4.5 V with minimum rise and fall times. The study of the circuit behaviour in high-temperature environments demonstrates its accuracy over a temperature range from -50 °C up to 200 °C, enabling programming of PCM based on innovative materials in applications requiring reliable operation at high temperatures.
Keywords :
buffer circuits; phase change memories; circuit behaviour; data retention performance; fall time; high-drive capability buffer; high-temperature environment; innovative materials; nonvolatile memory technology; operation reliability; phase change memories; programming pulses; programming window; pulse parameter; resistive loads; rise time; temperature -50 degC to 200 degC; temperature study; unity gain buffer; variable load PCM; voltage pulse; Computer architecture; Gain; Microprocessors; Phase change materials; Programming; Resistance; Temperature distribution;
Conference_Titel :
Ph.D. Research in Microelectronics and Electronics (PRIME), 2014 10th Conference on
Conference_Location :
Grenoble
DOI :
10.1109/PRIME.2014.6872704