• DocumentCode
    1777617
  • Title

    Multiple-event direct to histogram TDC in 65nm FPGA technology

  • Author

    Dutton, Neale ; Vergote, Johannes ; Gnecchi, Salvatore ; Grant, Lindsay ; Lee, David ; Pellegrini, Sara ; Rae, Bruce ; Henderson, Robert

  • Author_Institution
    Imaging Div., ST Microelectron., Edinburgh, UK
  • fYear
    2014
  • fDate
    June 30 2014-July 3 2014
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    A novel multiple-event Time to Digital Converter (TDC) with direct to histogram output is implemented in a 65nm Xilinx Virtex 5 FPGA. The delay-line based architecture achieves 16.3 ps temporal accuracy over a 2.86ns dynamic range. The measured maximum conversion rate of 6.17 Gsamples/s and the sampling rate of 61.7 Gsamples/s are the highest published in the literature. The system achieves a linearity of -0.9/+3 LSB DNL and -1.5/+5 LSB INL. The TDC is demonstrated in a direct time of flight optical ranging application with 12mm error over a 350mm range.
  • Keywords
    delay lines; field programmable gate arrays; time-digital conversion; LSB INL; Xilinx Virtex 5 FPGA technology; delay-line based architecture; flight optical ranging application; multiple-event direct to histogram TDC; multiple-event time to digital converter; size 65 nm; time 16.3 ps; Adaptive optics; Clocks; Field programmable gate arrays; Histograms; Linearity; Logic gates; Throughput;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ph.D. Research in Microelectronics and Electronics (PRIME), 2014 10th Conference on
  • Conference_Location
    Grenoble
  • Type

    conf

  • DOI
    10.1109/PRIME.2014.6872727
  • Filename
    6872727