Title :
Multiple-event direct to histogram TDC in 65nm FPGA technology
Author :
Dutton, Neale ; Vergote, Johannes ; Gnecchi, Salvatore ; Grant, Lindsay ; Lee, David ; Pellegrini, Sara ; Rae, Bruce ; Henderson, Robert
Author_Institution :
Imaging Div., ST Microelectron., Edinburgh, UK
fDate :
June 30 2014-July 3 2014
Abstract :
A novel multiple-event Time to Digital Converter (TDC) with direct to histogram output is implemented in a 65nm Xilinx Virtex 5 FPGA. The delay-line based architecture achieves 16.3 ps temporal accuracy over a 2.86ns dynamic range. The measured maximum conversion rate of 6.17 Gsamples/s and the sampling rate of 61.7 Gsamples/s are the highest published in the literature. The system achieves a linearity of -0.9/+3 LSB DNL and -1.5/+5 LSB INL. The TDC is demonstrated in a direct time of flight optical ranging application with 12mm error over a 350mm range.
Keywords :
delay lines; field programmable gate arrays; time-digital conversion; LSB INL; Xilinx Virtex 5 FPGA technology; delay-line based architecture; flight optical ranging application; multiple-event direct to histogram TDC; multiple-event time to digital converter; size 65 nm; time 16.3 ps; Adaptive optics; Clocks; Field programmable gate arrays; Histograms; Linearity; Logic gates; Throughput;
Conference_Titel :
Ph.D. Research in Microelectronics and Electronics (PRIME), 2014 10th Conference on
Conference_Location :
Grenoble
DOI :
10.1109/PRIME.2014.6872727