DocumentCode :
1777673
Title :
Role of nanowire length in morphological and electrical properties of silicon nanonets
Author :
Serre, Pauline ; Ternon, Celine ; Chapron, Pierre ; Durlin, Quentin ; Francheteau, Anais ; Lantreibecq, Arthur
Author_Institution :
LTM, UJF-Grenoble1, Grenoble, France
fYear :
2014
fDate :
June 30 2014-July 3 2014
Firstpage :
1
Lastpage :
4
Abstract :
While electronic devices based on a unique nanowire are intensively studied, we present here the potential of random assemblies of silicon nanowires (SiNWs) as interesting material for electronic applications. This structure, called a nanonet (for NANOstructured NETwork), exploits the unique properties of the nanowires such as high surface area and large aspect ratio while avoiding the long, expensive and complex processing required for individual nanowire devices. In this work, the vacuum filtration method is used to elaborate homogeneous, reproducible and conducting silicon nanonets. A study of the morphological and electrical behavior of such nanonets is provided as a function of the SiNW length and density. We demonstrate that despite the complexity of the nanonet geometry, it is possible to control their morphology and their electrical properties. Besides, we show that these characteristics strongly depend on the SiNW length and density. In view of the obtained properties, we demonstrate that Si nanonets are electrically active materials with interesting morphological properties and a potential for a wide range of applications and particularly in the sensing field.
Keywords :
elemental semiconductors; nanowires; silicon; vacuum techniques; SiNW density; SiNW length; aspect ratio; electrical properties; electrically active materials; electronic devices; morphological properties; nanonet geometry; nanostructured network; nanowire devices; nanowire length; random assemblies; sensing field; silicon nanonets; silicon nanowires; surface area; vacuum filtration method; Carbon; Carbon nanotubes; Filtration; Nanobioscience; Nanoscale devices; Silicon; Silicon nanowires; nanonets; percolation threshold;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Ph.D. Research in Microelectronics and Electronics (PRIME), 2014 10th Conference on
Conference_Location :
Grenoble
Type :
conf
DOI :
10.1109/PRIME.2014.6872755
Filename :
6872755
Link To Document :
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