• DocumentCode
    1778153
  • Title

    Fault injection and fault handling: An MPSoC demonstrator using IEEE P1687

  • Author

    Petersen, Kim ; Nikolov, Dimitar ; Ingelsson, Urban ; Carlsson, Gunnar ; Zadegan, Farrokh Ghani ; Larsson, Erik

  • Author_Institution
    Ericsson AB, Stockholm, Sweden
  • fYear
    2014
  • fDate
    7-9 July 2014
  • Firstpage
    170
  • Lastpage
    175
  • Abstract
    As fault handling in multi-processor system-on-chips (MPSoCs) is a major challenge, we have developed an MPSoC demonstrator that enables experimentation on fault injection and fault handling. Our MPSoC demonstrator consists of (1) an MPSoC model with a set of components (devices) each equipped with fault detection features, so called instruments, (2) an Instrument Access Infrastructure (IAI) based on IEEE P1687 that connects the instruments, (3) a Fault Indication and Propagation Infrastructure (FIPI) that propagates fault indications to system-level, (4) a Resource Manager (RM) to schedule jobs based on fault statuses, (5) an Instrument Manager (IM) connecting the IAI and the RM, and (6) a Fault Injection Manager (FIM) that inserts faults. The main goal of the demonstrator is to enable experimentation on different fault handling solutions. The novelty in this particular demonstrator is that it uses the existing test features, i.e. IEEE P1687 infrastructure, to assist fault handling. The demonstrator is implemented and a case study is performed.
  • Keywords
    IEEE standards; fault diagnosis; multiprocessing systems; system-on-chip; FIM; FIPI; IAI; IEEE P1687 infrastructure; MPSoC demonstrator model; RM; fault detection features; fault handling; fault indication and propagation infrastructure; fault injection manager; instrument access infrastructure; instrument manager; multiprocessor system-on-chips; resource manager; Circuit faults; Digital signal processing; Fault detection; Fault tolerance; Instruments; Registers; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    On-Line Testing Symposium (IOLTS), 2014 IEEE 20th International
  • Conference_Location
    Platja d´Aro, Girona
  • Type

    conf

  • DOI
    10.1109/IOLTS.2014.6873664
  • Filename
    6873664