• DocumentCode
    1778194
  • Title

    Framework for economical error recovery in embedded cores

  • Author

    Upasani, Gaurang ; Vera, Xavier ; Gonzalez, Adriana

  • Author_Institution
    Dept. d´Arquitectura de Computadors, Univ. Politec. de Catalunya, Barcelona, Spain
  • fYear
    2014
  • fDate
    7-9 July 2014
  • Firstpage
    146
  • Lastpage
    153
  • Abstract
    The vulnerability of the current and future processors towards transient errors caused by particle strikes is expected to increase rapidly because of exponential growth rate of on-chip transistors, the lower voltages and the shrinking feature size. This encourages innovation in the direction of finding new techniques for providing robustness in logic and memories that allow meeting the desired failures in-time (FIT) budget in future chip multiprocessors (CMPs) present in embedded systems. In embedded systems two aspects of robustness, error detection and containment, are of paramount importance. This paper proposes a light-weight and scalable architecture that uses acoustic wave detectors for error detection and contains errors at the core level. We show how selectively applying error containment can reduce the number of detectors required for error containment. We observe that by using 17 detectors we can achieve error containment coverage of 97.8%.
  • Keywords
    acoustic transducers; embedded systems; error detection; failure analysis; integrated logic circuits; microprocessor chips; radiation hardening (electronics); storage management chips; CMPs; FIT budget; acoustic wave detectors; chip multiprocessors; core level; economical error recovery; embedded cores; embedded systems; error containment; error detection; exponential growth rate; failures in-time; future processors; memories; on-chip transistors; particle strikes; transient errors; Acoustic waves; Checkpointing; Detectors; Embedded systems; Memory management; Program processors; Robustness;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    On-Line Testing Symposium (IOLTS), 2014 IEEE 20th International
  • Conference_Location
    Platja d´Aro, Girona
  • Type

    conf

  • DOI
    10.1109/IOLTS.2014.6873687
  • Filename
    6873687