Two complementary approaches for studying the effects of SEUs on HDL-based designs

Author

Mansour, Wassim ; Aguirre, M.A. ; Guzman-Miranda, H. ; Barrientos, Jorge ; Velazco, Raoul

Author_Institution

Lab. TIMA, Univ. Grenoble-Alpes, Grenoble, France

fYear

2014

fDate

7-9 July 2014

Firstpage

220

Lastpage

221

Abstract

In this paper, a comparison between two HDL-based fault-injection methods, FT-UNSHADES and NETFI, is presented. Fault-injection campaigns were performed on a third party example, named KECCAK sponge function family circuit dedicated for cryptography which is available as an open core. The comparison of both methodologies shows a similarity in the results and enlightens a problem that affects fault-injection systems related to how the synthesis and the simulation is made.

Keywords

cryptography; fault diagnosis; fault tolerant computing; field programmable gate arrays; hardware description languages; integrated circuit reliability; logic design; radiation hardening (electronics); FT-UNSHADES; HDL-based designs; HDL-based fault-injection methods; KECCAK sponge function family circuit; NETFI; SEU effect; complementary approaches; cryptography; fault tolerant-UNiversity of Sevilla hardware debugging system; fault-injection FPGA emulator; hardware description language; netlist fault injection method; Decision support systems; Testing; Fault Injection; Hardware Description Language; SRAM-based FPGA; Single Event Upsets;

fLanguage

English

Publisher

ieee

Conference_Titel

On-Line Testing Symposium (IOLTS), 2014 IEEE 20th International

Conference_Location

Platja d´Aro, Girona

Type

conf

DOI

10.1109/IOLTS.2014.6873702

Filename

6873702