DocumentCode
1778210
Title
Cross-layer early reliability evaluation: Challenges and promises
Author
Di Carlo, S. ; Vallero, Alessandro ; Gizopoulos, D. ; Di Natale, G. ; Gonzalez, Adriana ; Canal, Ramon ; Mariani, Riccardo ; Pipponzi, M. ; Grasset, Arnaud ; Bonnot, Philippe ; Reichenbach, Frank ; Rafiq, Gulzaib ; Loekstad, T.
Author_Institution
Politec. di Torino, Turin, Italy
fYear
2014
fDate
7-9 July 2014
Firstpage
228
Lastpage
233
Abstract
Evaluation of computing systems reliability must be accurate enough to provide hints for the required fault protection mechanisms that will guarantee correctness of operation at acceptance costs. To be useful, reliability evaluation must be performed early enough in the design cycle when, however, the available details of the system are largely unknown. This inherent contradiction in terms: early vs. accurate, requires a cross-layer approach for reliability evaluation. Different layers of abstraction contribute differently in the overall system reliability; if this contribution can be assessed independently, the reliability of the system can be evaluated at the early stages of the design. We review the state-of-the-art in the area and discuss corresponding challenges .
Keywords
electronic engineering computing; reliability; computing systems; cross-layer early reliability evaluation; design cycle; fault protection mechanisms; Testing; computing systems; reliability evalution;
fLanguage
English
Publisher
ieee
Conference_Titel
On-Line Testing Symposium (IOLTS), 2014 IEEE 20th International
Conference_Location
Platja d´Aro, Girona
Type
conf
DOI
10.1109/IOLTS.2014.6873704
Filename
6873704
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