DocumentCode :
1778210
Title :
Cross-layer early reliability evaluation: Challenges and promises
Author :
Di Carlo, S. ; Vallero, Alessandro ; Gizopoulos, D. ; Di Natale, G. ; Gonzalez, Adriana ; Canal, Ramon ; Mariani, Riccardo ; Pipponzi, M. ; Grasset, Arnaud ; Bonnot, Philippe ; Reichenbach, Frank ; Rafiq, Gulzaib ; Loekstad, T.
Author_Institution :
Politec. di Torino, Turin, Italy
fYear :
2014
fDate :
7-9 July 2014
Firstpage :
228
Lastpage :
233
Abstract :
Evaluation of computing systems reliability must be accurate enough to provide hints for the required fault protection mechanisms that will guarantee correctness of operation at acceptance costs. To be useful, reliability evaluation must be performed early enough in the design cycle when, however, the available details of the system are largely unknown. This inherent contradiction in terms: early vs. accurate, requires a cross-layer approach for reliability evaluation. Different layers of abstraction contribute differently in the overall system reliability; if this contribution can be assessed independently, the reliability of the system can be evaluated at the early stages of the design. We review the state-of-the-art in the area and discuss corresponding challenges .
Keywords :
electronic engineering computing; reliability; computing systems; cross-layer early reliability evaluation; design cycle; fault protection mechanisms; Testing; computing systems; reliability evalution;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
On-Line Testing Symposium (IOLTS), 2014 IEEE 20th International
Conference_Location :
Platja d´Aro, Girona
Type :
conf
DOI :
10.1109/IOLTS.2014.6873704
Filename :
6873704
Link To Document :
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