• DocumentCode
    1778210
  • Title

    Cross-layer early reliability evaluation: Challenges and promises

  • Author

    Di Carlo, S. ; Vallero, Alessandro ; Gizopoulos, D. ; Di Natale, G. ; Gonzalez, Adriana ; Canal, Ramon ; Mariani, Riccardo ; Pipponzi, M. ; Grasset, Arnaud ; Bonnot, Philippe ; Reichenbach, Frank ; Rafiq, Gulzaib ; Loekstad, T.

  • Author_Institution
    Politec. di Torino, Turin, Italy
  • fYear
    2014
  • fDate
    7-9 July 2014
  • Firstpage
    228
  • Lastpage
    233
  • Abstract
    Evaluation of computing systems reliability must be accurate enough to provide hints for the required fault protection mechanisms that will guarantee correctness of operation at acceptance costs. To be useful, reliability evaluation must be performed early enough in the design cycle when, however, the available details of the system are largely unknown. This inherent contradiction in terms: early vs. accurate, requires a cross-layer approach for reliability evaluation. Different layers of abstraction contribute differently in the overall system reliability; if this contribution can be assessed independently, the reliability of the system can be evaluated at the early stages of the design. We review the state-of-the-art in the area and discuss corresponding challenges .
  • Keywords
    electronic engineering computing; reliability; computing systems; cross-layer early reliability evaluation; design cycle; fault protection mechanisms; Testing; computing systems; reliability evalution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    On-Line Testing Symposium (IOLTS), 2014 IEEE 20th International
  • Conference_Location
    Platja d´Aro, Girona
  • Type

    conf

  • DOI
    10.1109/IOLTS.2014.6873704
  • Filename
    6873704