DocumentCode :
1778368
Title :
Terahertz emission from CuxO/Au thin film
Author :
Xu Lu ; Yonezawa, Teru
Author_Institution :
Div. of Mater. Sci. & Eng., Hokkaido Univ., Sapporo, Japan
fYear :
2014
fDate :
20-23 Oct. 2014
Firstpage :
164
Lastpage :
165
Abstract :
Terahertz (THz) emission from copper oxides/gold interface was detected on silicon substrates. The unexpected THz emission was attributed to Schokkty barrier at the interface. Degree of oxidation of the copper layer significantly affected the THz emission amplitude by the difference of electronic structures between cuprous oxide and cupric oxide.
Keywords :
Schottky barriers; copper compounds; gold; optical films; oxidation; silicon; terahertz wave spectra; CuxO-Au; CuxO/Au thin film; Schokkty barrier; Si; THz emission amplitude; copper layer; copper oxide/gold interface; electronic structures; oxidation degree; silicon substrates; terahertz emission; Copper; Gold; Oxidation; Photonics; Silicon; Sputtering; Schokkty Barrier; THz;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Photonics (MWP) and the 2014 9th Asia-Pacific Microwave Photonics Conference (APMP), 2014 International Topical Meeting on
Conference_Location :
Sapporo
Type :
conf
DOI :
10.1109/MWP.2014.6994519
Filename :
6994519
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1778368
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