Title :
Under voltage load shedding using voltage stability indices
Author :
Hamid, M.H.A. ; Hashim, Habibah ; Rashid, H.A.A. ; Abidin, I.Z.
Author_Institution :
Coll. of Electr. Power Eng., Univ. Tenaga Nasional, Kajang, Malaysia
Abstract :
Voltage instability is characterized by loss of a stable operating point due to reactive power deficiency, which causes a drop of voltage profile in significant part of the system. The voltage is stable if the system can maintain its voltage within the acceptable limits when there is a change in load admittance. Voltage collapse may occur when the system is subjected to system fault(s); the occurrence of this phenomenon can be either slowly or drastically depending on the severity of the fault(s) [1]. Therefore, it is more accurate to analyze the system behavior dynamically with respect to voltage stability. This paper presents under voltage load shedding scheme using voltage stability indexes based on system behavior in dynamic environment.
Keywords :
electric admittance; electric potential; load shedding; power system dynamic stability; power system faults; reactive power; UVLS method; dynamic environment; load admittance; power system faults; reactive power deficiency; system behavior; under voltage load shedding scheme; voltage collapse; voltage instability; voltage profile drop; voltage stability indexes; Asia; Generators; Indexes; Power system stability; Reactive power; Stability criteria; dynamic simulation; under voltage load shedding; voltage stability index;
Conference_Titel :
Innovative Smart Grid Technologies - Asia (ISGT Asia), 2014 IEEE
Conference_Location :
Kuala Lumpur
DOI :
10.1109/ISGT-Asia.2014.6873883