DocumentCode
1778517
Title
Disadvantages of flat panels for microfocus X-ray systems
Author
Ukho, N.
Author_Institution
Teleoptic PRA, Ltd., Kiev, Ukraine
fYear
2014
fDate
15-18 April 2014
Firstpage
319
Lastpage
321
Abstract
Images captured using standard flat digital detectors for microfocus X-ray systems have some disadvantages (uneven brightness distribution, irregular image resolution and geometrical distortions of the studying object). Using a non-planar detector (in the form of sphere surface part) will improve result image characteristics.
Keywords
X-ray imaging; brightness; flat panels; geometrical distortions; image characteristics; irregular image resolution; microfocus X-ray systems; sphere surface; standard flat digital detectors; uneven brightness distribution; Brightness; Conferences; Detectors; Image edge detection; Image resolution; Nanotechnology; X-ray imaging; geometrical distortions; image resolution; microfocus x-ray systems; signal intensity; x-ray detector;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics and Nanotechnology (ELNANO), 2014 IEEE 34th International Conference on
Conference_Location
Kyiv
Print_ISBN
978-1-4799-4581-8
Type
conf
DOI
10.1109/ELNANO.2014.6873906
Filename
6873906
Link To Document