DocumentCode :
1778576
Title :
Conductivity of metal (Al, Cu)-dielectric composites and modeling of the single- and multi-layer composite coatings for microwave applications
Author :
Borisova, A. ; Bondar, B. ; Machulyansky, A. ; Rodionov, M. ; Yakimenko, Y. ; Bovtun, V. ; Kempa, Martin
Author_Institution :
NTUU “Kiev Polytech. Inst.”, Kiev, Ukraine
fYear :
2014
fDate :
15-18 April 2014
Firstpage :
164
Lastpage :
167
Abstract :
Dielectric and conductivity spectra of metal-dielectric composites (epoxy resin with Al and Cu nanoparticles) were studied at high frequencies from 106 to 2 ^109 Hz and analyzed in the model of Cole-Cole relaxation. The experimental and modeled dielectric spectra are used for simulation of reflection, transmission and absorption of the electromagnetic waves in a free space caused by the single- and multilayer composite coatings. Possible microwave applications of the coatings are analyzed and discussed.
Keywords :
aluminium; copper; dielectric losses; electrical conductivity; filled polymers; high-frequency effects; metal-insulator boundaries; multilayers; nanocomposites; nanoparticles; permittivity; resins; Al; Cole-Cole relaxation; Cu; conductivity spectra; dielectric spectra; electromagnetic wave absorption; electromagnetic wave reflection; electromagnetic wave transmission; epoxy resin; frequency 10000000 Hz to 2000000000 Hz; high-frequency effect; metal-dielectric composites; microwave applications; multilayer composite coatings; nanoparticles; single-layer composite coatings; Absorption; Coatings; Conductivity; Dielectrics; Metals; Nonhomogeneous media; Reflection; conductivity; dielectric spectra; electrodynamic simulation; metal-dielectric composites; microwave absorption; reflection and transmission coefficients;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics and Nanotechnology (ELNANO), 2014 IEEE 34th International Conference on
Conference_Location :
Kyiv
Print_ISBN :
978-1-4799-4581-8
Type :
conf
DOI :
10.1109/ELNANO.2014.6873936
Filename :
6873936
Link To Document :
بازگشت