• DocumentCode
    1778582
  • Title

    CLEVER: Cross-layer error verification, evaluation and reporting

  • Author

    Vivas Maeda, Rafael Kioji ; Sill Torres, Frank

  • Author_Institution
    Sch. of Electr. Eng., Fed. Univ. of Minas Gerais, Belo Horizonte, Brazil
  • fYear
    2014
  • fDate
    1-5 Sept. 2014
  • Firstpage
    1
  • Lastpage
    7
  • Abstract
    The continuously progressing technology scaling is not only the source for increasing performance and complexity of embedded systems, but also the reason for rising reliability concerns of the underlying hardware. Consequently, numerous techniques emerged in recent years to mitigate wide range of error causes. Single layer methods, though, proved to be limited in providing an effective and efficient way to address errors in the system perspective. This paper proposes the new technology Cross-Layer Error Verification, Evaluation and Reporting (CLEVER), which is capable of gathering errors and system information on different levels of abstraction to evaluate the remaining useful lifetime of the system and its current state. Thus, CLEVER permits to overcome errors due to time-dependable and abrupt deterioration effects in complex embedded systems with a reasonable overhead. The presented system architecture was designed using a system description language and integrated in a simulation platform. Simulation results indicate the feasibility of this technology.
  • Keywords
    embedded systems; integrated circuit reliability; multiprocessing systems; remaining life assessment; system-on-chip; CLEVER; complex embedded systems; cross-layer error verification-evaluation and reporting technology; multiple processor system-on-chips; reliability; remaining useful lifetime evaluation; simulation platform; single layer methods; system architecture; system description language; system information; technology scaling; Computer architecture; Embedded systems; Monitoring; Program processors; Random access memory; Reliability; Sensors; Dependable embedded systems; cross-layer; management;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Integrated Circuits and Systems Design (SBCCI), 2014 27th Symposium on
  • Conference_Location
    Aracaju
  • Type

    conf

  • DOI
    10.1145/2660540.2660978
  • Filename
    6994630