DocumentCode
1778602
Title
Analysis of electric field and electrostatic potential distributions in porphyrin-coated silicon nanowire field-effect transistors
Author
Bodilovska, Daria ; Nozaki, Daijiro ; Baek, Eunhye
Author_Institution
Phys. & Biomed. Electron. Dept., Nat. Tech. Univ. of Ukraine, Kiev, Ukraine
fYear
2014
fDate
15-18 April 2014
Firstpage
119
Lastpage
122
Abstract
The aim of this work is to analyze the electric field and electric potential distributions in undoped silicon nanowire Schottky barrier field-effect transistors (SB-FETs) with a backgate configuration covered by chemical compound for sensor application. In this work we model porphyrin-coated silicon nanowire FETs (SiNW-FETs) and examine how the porphyrin covering the surface of the SiNW-FETs influences the electric field and electrostatic potential distributions. Especially we analyze the 1D electrostatic potential along the axis of the silicon nanowire channel for different values of gate voltages for the subsequent electron transport characteristics.
Keywords
Schottky barriers; Schottky gate field effect transistors; chemical sensors; coatings; electric field effects; electric potential; electron transport theory; elemental semiconductors; nanosensors; nanowires; organic compounds; silicon; 1D electrostatic potential distribution; SB-FET; Si; SiNW-FET; back-gate configuration; chemical compound; electric field analysis; electron transport characteristics; porphyrin-coated silicon nanowire field-effect transistor; sensor application; undoped silicon nanowire Schottky barrier field-effect transistor; Electric fields; Electric potential; Electrostatics; Field effect transistors; Logic gates; Silicon; electric field; electrostatic potential; field-effect transistors; porphyrin; silicone nanowire;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics and Nanotechnology (ELNANO), 2014 IEEE 34th International Conference on
Conference_Location
Kyiv
Print_ISBN
978-1-4799-4581-8
Type
conf
DOI
10.1109/ELNANO.2014.6873950
Filename
6873950
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