• DocumentCode
    1778602
  • Title

    Analysis of electric field and electrostatic potential distributions in porphyrin-coated silicon nanowire field-effect transistors

  • Author

    Bodilovska, Daria ; Nozaki, Daijiro ; Baek, Eunhye

  • Author_Institution
    Phys. & Biomed. Electron. Dept., Nat. Tech. Univ. of Ukraine, Kiev, Ukraine
  • fYear
    2014
  • fDate
    15-18 April 2014
  • Firstpage
    119
  • Lastpage
    122
  • Abstract
    The aim of this work is to analyze the electric field and electric potential distributions in undoped silicon nanowire Schottky barrier field-effect transistors (SB-FETs) with a backgate configuration covered by chemical compound for sensor application. In this work we model porphyrin-coated silicon nanowire FETs (SiNW-FETs) and examine how the porphyrin covering the surface of the SiNW-FETs influences the electric field and electrostatic potential distributions. Especially we analyze the 1D electrostatic potential along the axis of the silicon nanowire channel for different values of gate voltages for the subsequent electron transport characteristics.
  • Keywords
    Schottky barriers; Schottky gate field effect transistors; chemical sensors; coatings; electric field effects; electric potential; electron transport theory; elemental semiconductors; nanosensors; nanowires; organic compounds; silicon; 1D electrostatic potential distribution; SB-FET; Si; SiNW-FET; back-gate configuration; chemical compound; electric field analysis; electron transport characteristics; porphyrin-coated silicon nanowire field-effect transistor; sensor application; undoped silicon nanowire Schottky barrier field-effect transistor; Electric fields; Electric potential; Electrostatics; Field effect transistors; Logic gates; Silicon; electric field; electrostatic potential; field-effect transistors; porphyrin; silicone nanowire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics and Nanotechnology (ELNANO), 2014 IEEE 34th International Conference on
  • Conference_Location
    Kyiv
  • Print_ISBN
    978-1-4799-4581-8
  • Type

    conf

  • DOI
    10.1109/ELNANO.2014.6873950
  • Filename
    6873950