• DocumentCode
    1778646
  • Title

    Study of optical and mechanical resonances in indium oxide microrods

  • Author

    Bartolome, J. ; Cremades, A. ; Piqueras, J.

  • Author_Institution
    Dept. of Mater. Phys., Univ. Complutense of Madrid, Madrid, Spain
  • fYear
    2014
  • fDate
    15-18 April 2014
  • Firstpage
    39
  • Lastpage
    41
  • Abstract
    Indium oxide microrods with rectangular or hexagonal cross-sections have been grown by a catalyst free evaporation deposition method. Their luminescence properties have been investigated as well as whispering gallery resonances with improved Q-factor have been demonstrated for hexagonal and square cross-section rods. Electric field induced mechanical resonance of the microrods has been investigated by in-situ measurements in a scanning electron microscope (SEM). Young´s moduli of rods with different cross-sectional shapes have been determined from the measured resonance frequencies. Q factors in the range 1180-3780 obtained from the amplitude-frequency curves show that the In2O3 microrods are suitable as micromechanical resonators.
  • Keywords
    Q-factor; Young´s modulus; indium compounds; photoluminescence; rods (structures); scanning electron microscopy; semiconductor growth; vacuum deposition; whispering gallery modes; wide band gap semiconductors; In2O3; Q-factor; SEM; Young´s moduli; amplitude-frequency curves; catalyst free evaporation deposition method; electric field induced mechanical resonance; indium oxide microrods; luminescence properties; micromechanical resonators; optical resonances; scanning electron microscopy; whispering gallery resonances; Electrodes; Frequency measurement; Indium; Optical resonators; Optical sensors; Resonant frequency; Scanning electron microscopy; Young´s modulus; indium oxide microrods; luminescence; mechanical resonances; whispering gallery resonances;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics and Nanotechnology (ELNANO), 2014 IEEE 34th International Conference on
  • Conference_Location
    Kyiv
  • Print_ISBN
    978-1-4799-4581-8
  • Type

    conf

  • DOI
    10.1109/ELNANO.2014.6873974
  • Filename
    6873974