DocumentCode :
1779171
Title :
CMOS-fabricated tensile Ge microstructures: towards an edge-emitting laser
Author :
Capellini, Giovanni ; Reich, Christoph ; Guha, Saikat ; Yamamoto, Yusaku ; Lischke, S. ; Kreissl, Jochen ; Zimmermann, L. ; Virgilio, Matteo ; Ghrib, A. ; El Kurdi, M. ; Boucaud, P. ; Tillack, Bernd ; Schroeder, Thomas
Author_Institution :
IHP, Frankfurt (Oder), Germany
fYear :
2014
fDate :
2-4 June 2014
Firstpage :
133
Lastpage :
134
Abstract :
The realization of a Si-integrated light source represents today the "Holy Grail" of silicon photonics. An approach based on slightly tensile strained Ge/Si heterostructures has led to the demonstration of both optically and electrically pumped laser. This achievement has been welcomed by the scientific community as a leap toward a monolithically integrated silicon-based photonic platform. In this talk, a CMOS-based fabrication approach to obtain Ge microstripes on SOI substrates featuring uniaxial strain values up to -~1.5 % , resulting in an equivalent biaxial tensile strain value up to ε~9x10-3 is presented.
Keywords :
CMOS integrated circuits; elemental semiconductors; germanium; integrated optics; integrated optoelectronics; micro-optics; optical fabrication; semiconductor lasers; silicon; silicon-on-insulator; CMOS-fabricated tensile Ge microstructures; Ge-Si; SOI substrates; Si-integrated light source; biaxial tensile strain value; edge-emitting laser; electrically pumped laser; monolithically integrated silicon-based photonic platform; optically pumped laser; silicon photonics; uniaxial strain values; Decision support systems; Electronic mail; Lasers; Microstrip; Microstructure;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Silicon-Germanium Technology and Device Meeting (ISTDM), 2014 7th International
Conference_Location :
Singapore
Print_ISBN :
978-1-4799-5427-8
Type :
conf
DOI :
10.1109/ISTDM.2014.6874627
Filename :
6874627
Link To Document :
بازگشت