• DocumentCode
    1779171
  • Title

    CMOS-fabricated tensile Ge microstructures: towards an edge-emitting laser

  • Author

    Capellini, Giovanni ; Reich, Christoph ; Guha, Saikat ; Yamamoto, Yusaku ; Lischke, S. ; Kreissl, Jochen ; Zimmermann, L. ; Virgilio, Matteo ; Ghrib, A. ; El Kurdi, M. ; Boucaud, P. ; Tillack, Bernd ; Schroeder, Thomas

  • Author_Institution
    IHP, Frankfurt (Oder), Germany
  • fYear
    2014
  • fDate
    2-4 June 2014
  • Firstpage
    133
  • Lastpage
    134
  • Abstract
    The realization of a Si-integrated light source represents today the "Holy Grail" of silicon photonics. An approach based on slightly tensile strained Ge/Si heterostructures has led to the demonstration of both optically and electrically pumped laser. This achievement has been welcomed by the scientific community as a leap toward a monolithically integrated silicon-based photonic platform. In this talk, a CMOS-based fabrication approach to obtain Ge microstripes on SOI substrates featuring uniaxial strain values up to -~1.5 % , resulting in an equivalent biaxial tensile strain value up to ε~9x10-3 is presented.
  • Keywords
    CMOS integrated circuits; elemental semiconductors; germanium; integrated optics; integrated optoelectronics; micro-optics; optical fabrication; semiconductor lasers; silicon; silicon-on-insulator; CMOS-fabricated tensile Ge microstructures; Ge-Si; SOI substrates; Si-integrated light source; biaxial tensile strain value; edge-emitting laser; electrically pumped laser; monolithically integrated silicon-based photonic platform; optically pumped laser; silicon photonics; uniaxial strain values; Decision support systems; Electronic mail; Lasers; Microstrip; Microstructure;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Silicon-Germanium Technology and Device Meeting (ISTDM), 2014 7th International
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4799-5427-8
  • Type

    conf

  • DOI
    10.1109/ISTDM.2014.6874627
  • Filename
    6874627