Title :
Characterizing microdroplet evaporation using diffraction phase microscopy
Author :
Edwards, Chris ; Arbabi, Amir ; Bhaduri, Basanta ; Ganti, Raman ; Yunker, Peter J. ; Yodh, Arjun G. ; Popescu, Gabriel ; Goddard, Lynford L.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
Abstract :
Diffraction phase microscopy is a non-destructive in-situ characterization tool with nanometer height resolution that can measure 3-dimensional topography. We apply it to characterize microdroplets during evaporation without any a priori assumptions about the droplet geometry.
Keywords :
drops; evaporation; microfluidics; micromechanical devices; optical microscopy; surface topography measurement; 3-dimensional topography; diffraction phase microscopy; microdroplet evaporation; nanometer height resolution; nondestructive in-situ characterization tool; Diffraction; Educational institutions; Image resolution; Microscopy; Surface topography;
Conference_Titel :
Photonics Conference (IPC), 2014 IEEE
Conference_Location :
San Diego, CA
DOI :
10.1109/IPCon.2014.6995306
