Title :
A reliable 40 GHz opto-electrical system for characterization of frequency response of Ge PIN photo detectors
Author :
Wogong Zhang ; Kaiheng Ye ; Bechler, Stefan ; Ulbricht, Kai ; Oehme, Michael ; Kasper, Erich ; Schulze, J.
Author_Institution :
Inst. for Semicond. Eng., Univ. of Stuttgart, Stuttgart, Germany
Abstract :
This study presents calibration of a self-built 40 GHz measurement setup using vector network analyzer and Mach-Zehnder modulator. The setup is used for frequency response characterization of Ge PIN photodetectors.
Keywords :
Mach-Zehnder interferometers; calibration; elemental semiconductors; frequency response; germanium; photodetectors; Ge; Mach-Zehnder modulator; PIN photodetectors; calibration; frequency 40 GHz; frequency response; opto-electrical system; vector network analyzer; Erbium; Frequency response; Modulation; Reliability engineering; Semiconductor device measurement; Wavelength measurement;
Conference_Titel :
Silicon-Germanium Technology and Device Meeting (ISTDM), 2014 7th International
Conference_Location :
Singapore
Print_ISBN :
978-1-4799-5427-8
DOI :
10.1109/ISTDM.2014.6874649
