DocumentCode
177928
Title
Feature Learning Using Bayesian Linear Regression Model
Author
Siqi Nie ; Qiang Ji
Author_Institution
Dept. of Electr., Comput. & Syst. Eng., Rensselaer Polytech. Inst., Troy, NY, USA
fYear
2014
fDate
24-28 Aug. 2014
Firstpage
1502
Lastpage
1507
Abstract
Data representation plays a key role in many machine learning tasks. Specific domain knowledge can help design some features, but it often needs a long time to handcraft them. On the other hand, unsupervised learning can automatically learn a good representation of either labeled or unlabeled data. Currently one of the dominant approaches is the restricted Boltzmann machine (RBM). In this paper, we investigate an alternative approach for feature learning, which is based on Bayesian linear regression model. This model can also be denoted as Factor analysis, which is a statistical method for modeling the covariance structure of high dimensional data, but has not been used for feature learning. We will compare the proposed framework with RBM on different kinds of computer vision applications. Experiment results on different datasets are reported to demonstrate the effectiveness of the proposed feature learning framework.
Keywords
covariance analysis; data structures; learning (artificial intelligence); regression analysis; Bayesian linear regression model; RBM; covariance structure; data representation; domain knowledge; factor analysis; feature learning; machine learning; restricted Boltzmann machine; statistical method; unsupervised learning; Accuracy; Bayes methods; Computational modeling; Data models; Feature extraction; Linear regression; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Pattern Recognition (ICPR), 2014 22nd International Conference on
Conference_Location
Stockholm
ISSN
1051-4651
Type
conf
DOI
10.1109/ICPR.2014.267
Filename
6976977
Link To Document