DocumentCode :
1779281
Title :
Impact of crystalline structure on electrical property of NiGe/Ge contact
Author :
Yunsheng Deng ; Nakatsuka, Osamu ; Taoka, Noriyuki ; Zaima, Shigeaki
Author_Institution :
Grad. Sch. of Eng., Nagoya Univ., Nagoya, Japan
fYear :
2014
fDate :
2-4 June 2014
Firstpage :
85
Lastpage :
86
Abstract :
We can control the crystalline structure of NiGe layer on Ge(110) by controlling the deposition method, surface cleaning, and annealing temperature. We also investigated the impact of the interface crystalline structures on the electrical properties of NiGe/Ge(110) contacts. We found that thermal cleaning of Ge surface improves on the interfacial structure of the epitaxial NiGe/Ge(110) contact, that leads to lowering SBH.
Keywords :
annealing; crystal structure; elemental semiconductors; germanium; germanium alloys; interface structure; metallic epitaxial layers; nickel alloys; semiconductor-metal boundaries; surface cleaning; vacuum deposition; Ge; Ge(110) surface; NiGe-Ge; annealing; crystalline structure; electrical property; epitaxial contact; interfacial structure; surface cleaning; thermal cleaning; Cleaning; Educational institutions; Electronic mail; Facsimile; Grain boundaries; Lattices; Nickel;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Silicon-Germanium Technology and Device Meeting (ISTDM), 2014 7th International
Conference_Location :
Singapore
Print_ISBN :
978-1-4799-5427-8
Type :
conf
DOI :
10.1109/ISTDM.2014.6874682
Filename :
6874682
Link To Document :
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