• DocumentCode
    1779326
  • Title

    Strain profile, electronic band structure and optical gain of self-assembled Ge quantum dots on SiGe virtual substrate

  • Author

    Bose, Sayan ; Fan, W.J. ; Jian, C. ; Zhang, D.H. ; Tan, C.S.

  • Author_Institution
    Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, Singapore
  • fYear
    2014
  • fDate
    2-4 June 2014
  • Firstpage
    129
  • Lastpage
    130
  • Abstract
    In this paper, we study one such possible structure - self assembled Ge QDs embedded on Si0.5Ge0.5 virtual substrate with the same capping layer. A wetting layer is considered to simulate the actual scenario. Then we conduct a theoretical study on the strain and electronic band structure of this model. We employ the valence force field (VFF) method using Keating potential to estimate the strain followed by 8 band k·p method to calculate the electronic band structure taking the Γ valley into consideration. Finally we study the optical gain of the system for varying carrier concentrations.
  • Keywords
    Ge-Si alloys; VB calculations; band structure; carrier density; elemental semiconductors; germanium; self-assembly; semiconductor quantum dots; wetting; Ge-SiGe; Keating potential; SiGe; SiGe virtual substrate; carrier concentrations; electronic band structure; optical gain; self-assembled Ge quantum dots; strain profile; valence force field method; wetting layer; Charge carrier processes; Force; Materials; Optical refraction; Optical variables control; Quantum dots; Strain;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Silicon-Germanium Technology and Device Meeting (ISTDM), 2014 7th International
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4799-5427-8
  • Type

    conf

  • DOI
    10.1109/ISTDM.2014.6874705
  • Filename
    6874705