Title :
Charge storage and retention in electret dielectric layers for energy harvesting applications
Author :
Diaz-Ballester, A. ; Castillo-Anguera, S. ; Rafi, J.M. ; Gomez-Martinez, R. ; Abadal, G. ; Figueras, E. ; Plaza, J.A. ; Esteve, J. ; Mudarra, M. ; Canadas, J.C.
Author_Institution :
CNM (CSIC), Inst. de Microelectron. de Barcelona, Bellaterra, Spain
Abstract :
By providing a permanent electric polarization, electrets have a wide range of applications in different fields like sensors and actuators, energy harvesting or biomedicine. Stable electrets with silicon-based compatible technology are particularly pursued. In this work, different dielectric layer stacks, including SiO2, Si3N4, AL2O3 and AlN, are evaluated in terms of charge storage and retention. The corona charging characteristics are analyzed and local micro-breakdowns of the dielectric layers are observed for critical electric fields in the range of 6-7 MV/cm. A hexamethyldisilazane (HMDS) surface treatment is confirmed to provide an effective protection for electret charge retention. Unfortunately for potential applications involving liquids, the charge is found to vanish after electret surface soaking with either deionized water or ethanol. In principle, deeper charge storage in the electret dielectric layers could be achieved by using an alternative method based on charge injection by means of a direct contact. The results of first attempts with such alternative technique are also reported.
Keywords :
III-V semiconductors; aluminium compounds; charge injection; corona; electrets; energy harvesting; organic compounds; silicon compounds; surface charging; surface treatment; wide band gap semiconductors; Al2O3; AlN; Si3N4; SiO2; charge injection; charge storage; corona charging characteristics; deionized water; dielectric microbreakdowns; electret charge retention; electret dielectric layers; electret surface soaking; energy harvesting applications; ethanol; hexamethyldisilazane surface treatment; Dielectrics; Electrets; Electric potential; Silicon; Surface charging; Surface treatment; Voltage measurement; Al2O3; AlN; Electret; Si3N4; SiO2; charge stability; charge storage;
Conference_Titel :
Sensors (IBERSENSOR), 2014 IEEE 9th Ibero-American Congress on
Conference_Location :
Bogota
Print_ISBN :
978-1-4799-6835-0
DOI :
10.1109/IBERSENSOR.2014.6995520