• DocumentCode
    177975
  • Title

    Texture Defect Detection Using Independent Vector Analysis in Wavelet Domain

  • Author

    Sari, L. ; Ertuzun, A.

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Bogazici Univ., Istanbul, Turkey
  • fYear
    2014
  • fDate
    24-28 Aug. 2014
  • Firstpage
    1639
  • Lastpage
    1644
  • Abstract
    In this paper, we address the problem of defect detection in textile images, and present a novel hybrid method where independent vector analysis, a statistical method, is combined with wavelet transformation, a spectral method. Independent vector analysis, a generalization of independent component analysis, uses vectorized signals, thus, enables exploiting multiple datasets and offers a fully multivariate analysis. In this study, the multiple datasets are generated by wavelet transforming the texture image blocks of a predetermined size, and consequently, sub bands generated provide the dependent multiple datasets which are jointly processed to extract information from the dependencies present among them. Furthermore, subject diversity is introduced by taking these image blocks from multiple images corresponding to different textures in the TILDA database during the training phase. From this viewpoint, the proposed method may also be interpreted as a combination of independent vector analysis and group independent component analysis models. The proposed independent vector analysis based method is compared with the independent component analysis based method and some improvement from performance point of view is observed. Considering the results obtained, the proposed method can be an alternative solution to the defect detection problem.
  • Keywords
    image texture; independent component analysis; object detection; textiles; vectors; visual databases; wavelet transforms; TILDA database; group independent component analysis models; hybrid method; image blocks; independent vector analysis; multiple datasets; spectral method; statistical method; textile images; texture defect detection; vectorized signals; wavelet transformation; Accuracy; Indexes; Training; Vectors; Wavelet analysis; Wavelet transforms; Independent vector analysis; independent component analysis; texture analysis; wavelet transform;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pattern Recognition (ICPR), 2014 22nd International Conference on
  • Conference_Location
    Stockholm
  • ISSN
    1051-4651
  • Type

    conf

  • DOI
    10.1109/ICPR.2014.290
  • Filename
    6977000