DocumentCode
177975
Title
Texture Defect Detection Using Independent Vector Analysis in Wavelet Domain
Author
Sari, L. ; Ertuzun, A.
Author_Institution
Dept. of Electr. & Electron. Eng., Bogazici Univ., Istanbul, Turkey
fYear
2014
fDate
24-28 Aug. 2014
Firstpage
1639
Lastpage
1644
Abstract
In this paper, we address the problem of defect detection in textile images, and present a novel hybrid method where independent vector analysis, a statistical method, is combined with wavelet transformation, a spectral method. Independent vector analysis, a generalization of independent component analysis, uses vectorized signals, thus, enables exploiting multiple datasets and offers a fully multivariate analysis. In this study, the multiple datasets are generated by wavelet transforming the texture image blocks of a predetermined size, and consequently, sub bands generated provide the dependent multiple datasets which are jointly processed to extract information from the dependencies present among them. Furthermore, subject diversity is introduced by taking these image blocks from multiple images corresponding to different textures in the TILDA database during the training phase. From this viewpoint, the proposed method may also be interpreted as a combination of independent vector analysis and group independent component analysis models. The proposed independent vector analysis based method is compared with the independent component analysis based method and some improvement from performance point of view is observed. Considering the results obtained, the proposed method can be an alternative solution to the defect detection problem.
Keywords
image texture; independent component analysis; object detection; textiles; vectors; visual databases; wavelet transforms; TILDA database; group independent component analysis models; hybrid method; image blocks; independent vector analysis; multiple datasets; spectral method; statistical method; textile images; texture defect detection; vectorized signals; wavelet transformation; Accuracy; Indexes; Training; Vectors; Wavelet analysis; Wavelet transforms; Independent vector analysis; independent component analysis; texture analysis; wavelet transform;
fLanguage
English
Publisher
ieee
Conference_Titel
Pattern Recognition (ICPR), 2014 22nd International Conference on
Conference_Location
Stockholm
ISSN
1051-4651
Type
conf
DOI
10.1109/ICPR.2014.290
Filename
6977000
Link To Document