NF-FF transformation for emissions and security

Nowadays systems in many fields (e.g., automotive, medical and public transport) increase their complexity. Each of these system is composed by smaller apparatus that contains electronic components able to emit electromagnetic (EM) waves. This study describes a low cost method based on near-field (NF) to far-field (FF) transformation for radiated emission and emission security (Emsec) site survey analysis. Assembled systems need a EM verification to avoid unwanted EM emission in accordance with the current standard. Moreover EM leakages should be mitigated to avoid EM attacks. The results indicate that it is feasible use this methodology to analyze EM radiated emissions and for Emsec verification.