Title :
Network-based broadband modeling of material properties and passives from DC, RF, to THz domain accounting for anisotropy
Author :
Wane, S. ; Leyssenne, L. ; Bajon, D. ; Massenot, S. ; Russer, J. ; Russer, Peter ; Kuo, A. ; Brenneman, M.
Author_Institution :
NXP-Semicond., Caen, France
Abstract :
In this paper, experimental characterization and modeling of inhomogeneous materials from RF, mm-Wave to THz frequencies with emphasis on anisotropic materials including Liquid Crystal Polymers (LCP) and patterned silicon substrates using DT mesh are presented. Network-based broadband extraction of complex permittivity values and dissipation factors for various materials are discussed towards derivation of scalable models fulfilling Kramers-Kronig relationships for use in Time-Domain and Frequency-Domain modeling analysis.
Keywords :
Kramers-Kronig relations; frequency-domain analysis; liquid crystal polymers; permittivity; time-domain analysis; DC domain; DT mesh; Kramers-Kronig relationships; LCP; RF domain; THz domain; anisotropic materials; broadband extraction; complex permittivity values; dissipation factors; frequency-domain modeling analysis; liquid crystal polymers; material properties; mm-wave frequency; network-based broadband modeling; patterned silicon substrates; time-domain modeling analysis; Anisotropic magnetoresistance; Broadband communication; Diffusion tensor imaging; Materials; Permittivity; Permittivity measurement; Complex permittivity measurements; Deep Trench Isolation; THz time domain spectroscopy; liquid crystal polymers;
Conference_Titel :
Numerical Electromagnetic Modeling and Optimization for RF, Microwave, and Terahertz Applications (NEMO), 2014 International Conference on
Conference_Location :
Pavia
DOI :
10.1109/NEMO.2014.6995707
