Title :
Polyethylene-based nanodielectrics containing octaisobutyl polyhedral oligomeric silsesquioxanes obtained by solution blending in xylene
Author :
Meng Guo ; Frechette, Michel ; David, E. ; Demarquette, Nicole R. ; Daigle, Jean-Christophe
Author_Institution :
Ecole de Technol. Super. (ETS), Montréal, QC, Canada
Abstract :
Nanodielectrics have attracted the attention of many scientists and industrials as they may present superior dielectric properties compared to conventional dielectrics. Polyhedral Oligomeric SilSesquioxanes (POSS) is a type of filler of great interest in the field of nanodielectrics. In this work, xylene solution blending was used to produce Low Density Polyethylene (LDPE) based nanodielectrics containing 1 wt% and 5 wt% Octaisobutyl POSS (OibPOSS). The resulting dielectrics were characterized using Fourier transform infrared spectroscopy, scanning electron microscopy, broadband dielectric spectroscopy and progressive-stress breakdown tests. The results showed that (i) solution blending in xylene seemed to be an effective method to disperse OibPOSS within LDPE in nano to micron sizes and (ii) the resulting dielectrics presented dielectric properties similar to those of LDPE.
Keywords :
Fourier transform infrared spectroscopy; blending; polyethylene insulation; polymer blends; scanning electron microscopy; Fourier transform infrared spectroscopy; LDPE based nanodielectrics; Octaisobutyl POSS; OibPOSS; broadband dielectric spectroscopy; low density polyethylene based nanodielectrics; octaisobutyl polyhedral oligomeric silsesquioxanes; progressive-stress breakdown tests; scanning electron microscopy; xylene solution blending; Dielectric breakdown; Dielectrics; Insulation; Permittivity; Polymers; Octaisobutyl polyhedral oligomeric silsesquioxanes; Polyethylene; dielectric properties; morphology; nanodielectrics; xylene;
Conference_Titel :
Electrical Insulation and Dielectric Phenomena (CEIDP), 2014 IEEE Conference on
Conference_Location :
Des Moines, IA
DOI :
10.1109/CEIDP.2014.6995752