DocumentCode :
1780018
Title :
Monte Carlo studies of hot electron transport and high field degradation
Author :
Ying Sun ; Boggs, S.A. ; Ramprasad, Ramamurthy
Author_Institution :
Inst. of Mater. Sci., Univ. of Connecticut, Storrs, CT, USA
fYear :
2014
fDate :
19-22 Oct. 2014
Firstpage :
15
Lastpage :
18
Abstract :
The problem of hot electron transport and energy loss at high electric fields in insulators is of considerable interest in the context of dielectric breakdown and hot carrier induced degradation. Hot electron transport is discussed in terms of electron-phonon scattering in polymeric dielectrics. Monte Carlo (MC) simulation provides the basis for study of hot electron transport in thin polyethylene (PE) films. Electron trajectories and spatial evolution of the electron energy distribution are presented. Possible molecular degradation mechanisms are discussed.
Keywords :
Monte Carlo methods; electron-phonon interactions; energy loss of particles; hot carriers; insulators; polymer films; Monte Carlo simulation; dielectric breakdown; electron energy distribution; electron trajectories; electron-phonon scattering; energy loss; high field degradation; hot carrier induced degradation; hot electron transport; insulators; molecular degradation mechanisms; polymeric dielectrics; spatial evolution; thin polyethylene films; Cavity resonators; Degradation; Electric fields; Phonons; Polymers; Scattering; Spontaneous emission; Breakdown; Degradation; Electons; Monte Carlo;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation and Dielectric Phenomena (CEIDP), 2014 IEEE Conference on
Conference_Location :
Des Moines, IA
Type :
conf
DOI :
10.1109/CEIDP.2014.6995782
Filename :
6995782
Link To Document :
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