DocumentCode :
1780034
Title :
Dark current measurements in pressurized SF6: Influence of relative humidity and temperature
Author :
Zavattoni, L. ; Hanna, Rachelle ; Lesaint, O. ; Gallot-Lavallee, O.
Author_Institution :
Siemens Transm. & Distrib., Grenoble, France
fYear :
2014
fDate :
19-22 Oct. 2014
Firstpage :
23
Lastpage :
26
Abstract :
Current measurements in pressurized gases at high electric field are performed using electrodes with coaxial geometry. To identify the main mechanisms involved in “dark current” measured, the influences of electrode roughness, gas pressure, relative humidity and temperature have been investigated. The experimental results reveal that charge injection from the electrode constitute the main mechanism responsible for dark current. The latter is considerably modified when relative humidity RH is changed via the influence of pressure and temperature. The measured current shows an exponential increase versus electric field and also versus RH. It is thus assumed that water adsorbed on the electrodes induces an enhancement of charge injection from the electrode surface.
Keywords :
charge injection; coaxial cables; electric current measurement; electric fields; electrodes; gas insulated transmission lines; humidity; power cable insulation; SF6; charge injection; dark current measurements; electric field; electrode roughness; gas pressure; pressurized SF6; pressurized gases; relative humidity; Current measurement; Dark current; Electric fields; Electrodes; Humidity; Sulfur hexafluoride; Temperature measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation and Dielectric Phenomena (CEIDP), 2014 IEEE Conference on
Conference_Location :
Des Moines, IA
Type :
conf
DOI :
10.1109/CEIDP.2014.6995793
Filename :
6995793
Link To Document :
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