Title :
Electron swarm parameters in gas mixtures of CF3I, SF6, CO2 with N2 at atmospheric pressure
Author :
Omori, Tatsuya ; Shimizu, Daisuke ; Matsumoto, Tad ; Izawa, Y. ; Nishijima, K.
Author_Institution :
High-Voltage & Discharge Plasma Lab., Grad. Sch. of Eng. Power, Fukuoka, Japan
Abstract :
This paper presents the insulation characteristics of gas mixture containing CF3I as an alternative to SF6 from the view point of electron swarm parameters. The electron swarm parameters including electron attachment and multiplication, electron drift velocity and the effective ionization coefficient were investigated both experimentally and numerically in gas mixtures of CF3I, SF6, CO2 with N2 at atmospheric pressure. In the experiment, weakly-ionized plasma was generated between a quasi-uniform field gap by pulse laser irradiation in test gas, and the electron drift velocity and the effective ionization coefficient were estimated from the electron current waveforms at various electric field strength. In addition, the measured results were compared with numerical results calculated by means of Monte Carlo Simulation. As a result, the measured result of electron drift velocity was in good agreement with calculated one. It was revealed that dilute CF3I in N2 had a strong electron attachment effect as well or better to dilute SF6 in N2 at atmospheric pressure.
Keywords :
carbon compounds; gas mixtures; gaseous insulation; ionisation; nitrogen; sulphur compounds; CF3I-SF6-CO2-N2; Monte Carlo simulation; atmospheric pressure; effective ionization coefficient; electron attachment; electron drift velocity; electron multiplication; electron swarm parameter; gas mixtures; insulation characteristics; pulse laser irradiation; quasiuniform field gap; weakly ionized plasma; Electrodes; Equations; Gas lasers; Insulation; Ions; Numerical analysis; Pressure measurement; CF3I; SF6; effective ionization coefficien; electron drift velocity; electron swarm;
Conference_Titel :
Electrical Insulation and Dielectric Phenomena (CEIDP), 2014 IEEE Conference on
Conference_Location :
Des Moines, IA
DOI :
10.1109/CEIDP.2014.6995820