DocumentCode :
1780105
Title :
Discussion on impedance measurements and bulk ohmic conductivity in lossy dielectrics
Author :
Tuncer, Enis
Author_Institution :
Mater. Platform, Semicond. Packaging, Technol. & Manuf. Group, Texas Instrum. Inc., Dallas, TX, USA
fYear :
2014
fDate :
19-22 Oct. 2014
Firstpage :
844
Lastpage :
847
Abstract :
Not all dielectrics are perfect. The experimentalist would know how materials would react to an external excitation, and would record bulk conductivity values depending on their test setups and measurement system. To measure the correct bulk conductivity isothermal time domain measurement at room temperature could take long times and requires good current measurement and sometimes high voltage setups. Frequency domain measurements on the other hand have their advantages based on the frequency-temperature superposition and cost of instrumentation. This does not mean that the time-temperature superposition is not plausible; however, it is not common to perform measurements. In this contribution details of studying bulk conductivity in lossy dielectric will be presented with straight forward numerical analysis tools. Numerical data from synthetic data will be used to illustrate how to separate charge transport (bulk conductivity) from polarization current. The synthetic data were generated using empirical formulas and different temperature dependencies. It is recommended that the lossy dielectrics analyzed in the complex resistivity level.
Keywords :
dielectric loss measurement; electric current measurement; electric impedance measurement; electrical conductivity measurement; bulk conductivity isothermal time domain measurement; bulk ohmic conductivity; charge transport; complex resistivity level; current measurement; external excitation; frequency domain measurements; frequency-temperature superposition; high voltage setups; impedance measurements; instrumentation cost; lossy dielectrics; numerical analysis tools; temperature dependencies; Conductivity; Current measurement; Dielectric measurement; Dielectrics; Materials; Temperature measurement; Voltage measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation and Dielectric Phenomena (CEIDP), 2014 IEEE Conference on
Conference_Location :
Des Moines, IA
Type :
conf
DOI :
10.1109/CEIDP.2014.6995829
Filename :
6995829
Link To Document :
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