DocumentCode :
1780136
Title :
Wavelet Packet Transform based Multi Resolution Analysis technique for classification of LC waveforms on polluted insulating surfaces
Author :
Chaou, A.K. ; Mekhaldi, A. ; Teguar, M. ; Fofana, I. ; Meghnefi, F.
Author_Institution :
Lab. de Rech. en Electrotech., Ecole Nat. Polytech. d´Alger, Algiers, Algeria
fYear :
2014
fDate :
19-22 Oct. 2014
Firstpage :
291
Lastpage :
294
Abstract :
This paper expose a novel algorithm to monitor and classify the pollution severity level of insulators based on Leakage Current (LC) waveforms investigation. For this purpose, LC waveforms acquisition is firstly carried out on a plane insulator model under various saline pollution conductivities. Then, LC is investigated and decomposed in five levels using the Wavelet Packet Transform (WPT). Two, four, eight, sixteen and thirty-two coefficients are obtained from the first level to the fifth one respectively. Next, Standard Deviation-Multi Resolution Analysis (STD-MRA) is used to extract features from WPT coefficients. It is noted that the higher the pollution severity, the higher the STD value. Finally, STD values are used as inputs to three well known classification methods (K-Nearest Neighbors, Naïve Bayes and Support Vector Machines), while the sole output is the pollution conductivity value. Results announce that the higher the decomposition level, the better the classification performance. WPT methodology is presented as a highly efficient technique for LC investigation and classification.
Keywords :
feature extraction; insulator contamination; pattern classification; power engineering computing; support vector machines; wavelet transforms; K-nearest neighbors classification method; LC waveform classification; LC waveforms acquisition; Naïve Bayes classification method; STD-MRA; WPT; feature extraction; insulator pollution severity level; leakage current waveforms; multiresolution analysis technique; polluted insulating surfaces; pollution conductivity value; saline pollution conductivities; standard deviation-multiresolution analysis; support vector machines classification method; wavelet packet transform; Discrete wavelet transforms; Feature extraction; Insulators; Pollution; Wavelet packets;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation and Dielectric Phenomena (CEIDP), 2014 IEEE Conference on
Conference_Location :
Des Moines, IA
Type :
conf
DOI :
10.1109/CEIDP.2014.6995845
Filename :
6995845
Link To Document :
بازگشت