DocumentCode
1780634
Title
Iris recognition using block local binary patterns and relational measures
Author
Nigam, Abhishek ; Krishna, Vamshi ; Bendale, Amit ; Gupta, Puneet
Author_Institution
Dept. of Comput. Sci. & Eng., Indian Inst. of Technol. Kanpur, Kanpur, India
fYear
2014
fDate
Sept. 29 2014-Oct. 2 2014
Firstpage
1
Lastpage
6
Abstract
Iris biometrics is widely used because of highly discriminative characteristics that are found in iris. But designing an iris recognition system which is invariant to extrinsic factors such as illumination, noise, camera-to-eye distance is fairly challenging. This paper proposes a novel iris recognition approach which takes into account the iris structure, illumination variation, occlusion, noise and rotational variance. A feature extraction technique exploiting the local iris features has been proposed that uses two features extracted from different blocks of an iris. The features are extracted from suitably modified pixel values which are enhanced to improve robustness of the technique. Relational measure is proposed that considers both radial and circumferential features which is combined with the block local binary pattern (BLBP). The BLBP is applied in an unconventional block-wise manner adaptive to the iris structure. Finally scores are fused at score level. Experimental results on two publicly available Casia Interval and Lamp databases as well as on our IITK iris database demonstrates the usefulness of the proposed system.
Keywords
feature extraction; iris recognition; BLBP; Casia interval; IITK iris database; Lamp databases; block local binary patterns; camera-to-eye distance; circumferential features; discriminative characteristics; illumination variation; iris biometrics; iris feature extraction; iris recognition system; iris structure; noise; occlusion; pixel values; radial; relational measures; rotational variance; Databases; Eyelids; Feature extraction; Histograms; Iris; Iris recognition; Lighting;
fLanguage
English
Publisher
ieee
Conference_Titel
Biometrics (IJCB), 2014 IEEE International Joint Conference on
Conference_Location
Clearwater, FL
Type
conf
DOI
10.1109/BTAS.2014.6996263
Filename
6996263
Link To Document