DocumentCode :
1780694
Title :
CSST: An Efficient Secure Split-Test for Preventing IC Piracy
Author :
Rahman, M.T. ; Forte, Domenic ; Quihang Shi ; Contreras, Gustavo K. ; Tehranipoor, Mohammad
Author_Institution :
ECE Dept., Univ. of Connecticut, Storrs, CT, USA
fYear :
2014
fDate :
14-16 May 2014
Firstpage :
43
Lastpage :
47
Abstract :
With the high costs associated with modern IC fabrication, most semiconductor companies have gone fabless, i.e., they outsource manufacturing of their designs to contract foundries. This horizontal business model has led to many well documented issues associated with untrusted foundries including IC overproduction and shipping improperly or insufficiently tested chips. Entering such chips in the supply chain can be catastrophic for critical applications. We propose a new Secure Split-Test to give control over testing back to the IP owner. Each chip is locked during test. The IP owner is the only entity who can interpret the locked test results and unlock passing chips. In this way, SST can prevent shipping overproduction and defective chips from reaching the supply chain. The proposed method considerably simplifies the communication required between the foundry and IP owner compared to the original version of the secure split test. The results demonstrate that our new technique is more secure than the original and with less communication barriers.
Keywords :
integrated circuit testing; supply chain management; CSST; IC fabrication; IC overproduction; IC piracy prevention; IC shipping; IP owner; communication barriers; efficient secure split-test; horizontal business model; outsource manufacturing; semiconductor companies; supply chain; Assembly; Foundries; IP networks; Integrated circuits; Security; Supply chains; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Workshop (NATW), 2014 IEEE 23rd North Atlantic
Conference_Location :
Johnson City, NY
Print_ISBN :
978-1-4799-5134-5
Type :
conf
DOI :
10.1109/NATW.2014.17
Filename :
6875447
Link To Document :
بازگشت