DocumentCode
1780707
Title
Asynchronous Fault Detection in IEEE P1687 Instrument Network
Author
Shibin, Konstantin ; Devadze, Sergei ; Jutman, Artur
Author_Institution
Dept. of Comput. Eng. Tallinn, Tallinn Univ. of Technol., Tallinn, Estonia
fYear
2014
fDate
14-16 May 2014
Firstpage
73
Lastpage
78
Abstract
The paper describes asynchronous fault detection in silicon chips with network of embedded instruments based on IEEE P1687 IJTAG. This technique allows faster fault detection and localization by using asynchronous signal propagation from instruments to instrumentation network controller. The additional hardware is described, scenarios of operation including multiple simultaneous fault detection and localization are analysed.
Keywords
IEEE standards; elemental semiconductors; fault diagnosis; integrated circuit reliability; silicon; IEEE P1687 IJTAG; IEEE P1687 instrument network; Si; asynchronous fault detection; asynchronous signal propagation; embedded instruments; fault localization; instrumentation network controller; multiple simultaneous fault detection; silicon chips; Fault detection; Fault tolerance; Fault tolerant systems; Hardware; Instruments; Registers; Standards; IJTAG; P1687; asynchronous fault detection; fault management;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Workshop (NATW), 2014 IEEE 23rd North Atlantic
Conference_Location
Johnson City, NY
Print_ISBN
978-1-4799-5134-5
Type
conf
DOI
10.1109/NATW.2014.24
Filename
6875454
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