Application of Generalized Equivalent Circuits (GEC) method for Calculating of the diffraction by dielectric obstacles with finite thickness in metallic waveguide: Application to the characterization of vegetation leaves

In this paper, we develop an electromagnetic analysis of a rectangular waveguide loaded with a dielectric model that is composed of a leaf plant with a finite thickness. By applying the Generalized Equivalent Circuits (GEC), we can determine the wave diffraction according to the dielectric properties. To validate this work, our obtained results are compared with those previously published and measured. We have seen a good agreement is presented.