DocumentCode :
1781113
Title :
On the use of physical basis functions in a sparse expansion for electromagnetic scattering signatures
Author :
Halman, Jennifer I. ; O´Donnell, A.N. ; Burkholder, Robert J.
Author_Institution :
Ohio State Univ., Columbus, OH, USA
fYear :
2014
fDate :
19-23 May 2014
Abstract :
This paper explores the use of physical basis functions as an efficient and insightful sparse expansion for representing the electromagnetic scattering from large finite targets. Such an expansion is central to applying compressed sensing techniques. The closed-form physical optics solution for scattering from an arbitrary flat plate is used to extract the physical basis functions related to scattering mechanisms of edge and corner diffraction, and specular reflection. Orthogonal matching pursuits is applied to find the coefficients of the sparse expansion from the calculated scattered fields of a plate as a function of frequency and angle. Convergence is demonstrated as a function of the number of basis functions and compressed sensing samples.
Keywords :
compressed sensing; electromagnetic wave diffraction; electromagnetic wave reflection; electromagnetic wave scattering; iterative methods; physical optics; time-frequency analysis; arbitrary flat plate; closed-form physical optics solution; compressed sensing techniques; corner diffraction; edge diffraction; electromagnetic scattering signatures; large finite targets; orthogonal matching pursuits; physical basis function extraction; sparse expansion coefficients; specular reflection; Compressed sensing; Diffraction; Electromagnetic scattering; Frequency dependence; Reflection; Vectors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radar Conference, 2014 IEEE
Conference_Location :
Cincinnati, OH
Print_ISBN :
978-1-4799-2034-1
Type :
conf
DOI :
10.1109/RADAR.2014.6875680
Filename :
6875680
Link To Document :
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