In-band OSNR monitoring with a high sensitivity silicon photonics system-on-chip

Author

Annoni, Andrea ; Melloni, A. ; Strain, Michael J. ; Sorel, Marc ; Morichetti, Francesco

Author_Institution

Dipt. di Elettron., Inf. e Bioingegneria, Politec. di Milano, Milan, Italy

fYear

2014

fDate

6-10 July 2014

Firstpage

1

Lastpage

4

Abstract

A high sensitivity in-band OSNR monitor system integrated on SOI platform is presented. The device exploits a narrow-band microring resonator to select the portion of the channel spectrum that is most sensitive to OSNR variations, and performs an autocorrelation measurement using a Mach-Zehnder interferometer. The proposed scheme allows in-line OSNR monitoring from 8 dB to 28 dB, with 0.2 dB accuracy.

Keywords

Mach-Zehnder interferometers; integrated optics; microcavities; monitoring; optical noise; optical resonators; silicon; system-on-chip; Mach-Zehnder interferometer; SOI platform; autocorrelation measurement; high sensitivity silicon photonics system-on-chip; in-band OSNR monitoring; narrow-band microring resonator; Monitoring; Optical filters; Optical interferometry; Optical noise; Optical resonators; Sensitivity; Signal to noise ratio; delay-line interferometer; in-band optical signal-to-noise ratio (OSNR); integrated optics devices; optical performance monitoring; silicon photonics;

fLanguage

English

Publisher

ieee

Conference_Titel

Transparent Optical Networks (ICTON), 2014 16th International Conference on

Conference_Location

Graz

Type

conf

DOI

10.1109/ICTON.2014.6876541

Filename

6876541